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Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.


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Proceedings ArticleDOI
21 Jun 2010
TL;DR: In this paper, the effect of index of refraction of the material in the transmission of electromagnetic waves was investigated, and it was shown that the transmission through the slab is completely different if the index of the refractive index is a function of frequency.
Abstract: Consider a material slab situated between two half free spaces. An electromagnetic waves is obliquely incident on it. We investigate the effect of index of refraction of the material in the transmission of electromagnetic waves. We study three cases of the material: real positive index of refraction, real negative index of refraction and the refractive index is a function of frequency of the incident waves. We show that the transmission of electromagnetic waves through the slab is indifferent whether the index of refraction is real positive or negative. We also show that the transmission through the slab is completely different if the index of refraction is a function of frequency.

1 citations

Journal ArticleDOI
TL;DR: In this paper, the authors applied scanning electron microscopy and total-reflection-angle X-ray spectroscopy (SEM-TRAXS) for fluorescence analysis of 50 A- and 125 A-thick Au thin films on Si(100).
Abstract: Scanning electron microscopy & total-reflection-angle X-ray spectroscopy (SEM-TRAXS) was applied for fluorescence X-ray analysis of 50 A- and 125 A-thick Au thin films on Si(100). The intensity of the AuM line (2.15 keV) emitted from the Au thin films varied as a function of the take-off angle (θt) with respect to the film surface; the intensity of AuM line from the 125 A-thick Au thin film was 1.5 times as large as that of SiKα line (1.74 keV) emitted from the Si substrate when θt=0°-3°, in the vicinity of a critical angle for total external reflection of the AuM line at Si (0.81°). In addition, the intensity of the AuM line emitted from the 50 A-thick Au thin film was also sufficiently strong for chemical analysis.

1 citations

Proceedings ArticleDOI
10 Nov 1998
TL;DR: In this article, the authors investigated the possibility to exploit the Bragg diffraction from mosaic crystals as a reflection technique for the realization of lobster-eye telescopes for hard x-rays.
Abstract: In this paper will be investigated the possibility to exploit the Bragg diffraction from mosaic crystals as a reflection technique for the realization of lobster-eye telescopes for hard x-rays In particular for our study we will assume the particular lobster-eye configuration also known as Schmidt imager This geometry is particularly interesting not only why it can allow a 1D focusing over large fields of view but also because it is relatively easy to be realized, being based on flat reflectors Until now lobster-eye telescopes have been mostly studied for applications in the classical x-ray band, making use of total external reflection at grazing angles mirrors However, due to the much larger reflection angles typical of Bragg diffraction it is possible to extend the use of the Schmidt geometry also to the hard x-ray energy band Here, in addition to a general description of the behavior of Schmidt telescopes based on the Bragg diffraction technique, we will report also some theoretical evaluations about the performances achievable with these devices

1 citations

Journal ArticleDOI
01 Oct 2013-Optik
TL;DR: In this article, the relationship between background refractive index and negative refraction was investigated by using the finite-difference time-domain (FDTD) method on software RSoft.

1 citations

Proceedings ArticleDOI
18 Feb 2004
TL;DR: In this paper, the authors used laser reflectometry near the critical angle to study particle adsorption on a flat surface, which allows direct measurement of reflectivity and its angle derivative on the prism surface where is formed the film.
Abstract: Reflection and transmission of the light in a random medium are composed by coherent and incoherent waves. The coherent one can be modeled as interacting with a medium with effective optical coefficients. In a random dilute suspension, the coherent wave travels in a medium with an effective index of refraction given by the van de Hulst formula. This effective index is, in general, complex. The imaginary part takes into account the loss of the coherent wave due to scattering. Internal reflection, due to random particles in suspension defines a critical angle determined by the effective index of refraction of the particles in suspension. The curve of reflectivity is smoothed near the critical angle by the imaginary part of the effective index of refraction. One can show that the diffuse component of the reflection tends to zero at the critical angle. In this work, laser reflectometry near the critical angle is used to study particle adsorption on a flat surface. We monitored the adsorption of polystyrene particles with positive and negative charge in suspension. This method allows the direct measuring of reflectivity and its angle derivative on the prism surface where is formed the film.

1 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20224
20214
20206
20198
20189
201710