Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
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TL;DR: In this paper, it was shown that the complex index of refraction of a given particle-size distribution may be calculated if the particle extinction coefficient and the particle absorption coefficient are known.
Abstract: It is shown that the complex index of refraction of a given particle-size distribution may be calculated if the particle extinction coefficient and the particle absorption coefficient are known. If the particles are assumed to be nonabsorbing, a real index of refraction may be calculated from the ratio of light scattering at 45° from the forward for two wavelengths. Application of the method to two stations off Ecuador indicates that the particle index of refraction can be determined with sufficient accuracy to become an important parameter in the study of the oceans.
46 citations
Patent•
01 Dec 2010
TL;DR: Low index layers can be used in optical constructions that have multi-tiered light confinement as discussed by the authors, where a first tier of reflection is provided when light is reflected at the surface of a low index optical film which is disposed directly or indirectly on a light guide.
Abstract: Optical constructions use a low index of refraction layer disposed between a low absorption layer and a high absorption layer to increase confinement of light to the low absorption region of the optical constructions. Low index layers can be used in optical constructions that have multi-tiered light confinement. In these constructions, a first tier of reflection is provided when light is reflected at the surface of a low index optical film which is disposed directly or indirectly on a light guide. A second tier of reflection occurs at the surface of a light redirecting film having appropriately oriented refractive structures.
46 citations
TL;DR: The performance of a critical-angle transmission (CAT) grating in the EUV and soft x-ray band is demonstrated that for the first time combines the advantages of transmission gratings with the superior broadband efficiency of blazed reflection gratings via reflection from nanofabricated periodic arrays of atomically smooth nanometer-thin silicon mirrors.
Abstract: Diffraction gratings are ubiquitous wavelength dispersive elements for photons as well as for subatomic particles, atoms, and large molecules. They serve as enabling devices for spectroscopy, microscopy, and interferometry in numerous applications across the physical sciences. Transmission gratings are required in applications that demand high alignment and figure error tolerances, low weight and size, or a straight-through zero-order beam. However, photons or particles are often strongly absorbed upon transmission, e.g., in the increasingly important extreme ultraviolet (EUV) and soft x-ray band, leading to low diffraction efficiency. We demonstrate the performance of a critical-angle transmission (CAT) grating in the EUV and soft x-ray band that for the first time combines the advantages of transmission gratings with the superior broadband efficiency of blazed reflection gratings via reflection from nanofabricated periodic arrays of atomically smooth nanometer-thin silicon mirrors at angles below the critical angle for total external reflection. The efficiency of the CAT grating design is not limited to photons, but also opens the door to new, sensitive, and compact experiments and applications in atom and neutron optics, as well as for the efficient diffraction of electrons, ions, or molecules.
46 citations
TL;DR: In this paper, a class of negative index (n) materials has interesting anisotropic optical properties, manifest in the effective refraction index that can be positive, negative, or purely imaginary under different incidence conditions.
Abstract: We show that a class of negative index (n) materials has interesting anisotropic optical properties, manifest in the effective refraction index that can be positive, negative, or purely imaginary under different incidence conditions. With dispersion taken into account, reflection at a planar negative-index interface exhibits frequency selective total oblique transmission that is distinct from the Brewster effect. Finite-difference-timedomain simulation of realistic negative-n structures confirms the analytic results based on effective indices.
46 citations
TL;DR: In this article, the Fourier transform algorithm was used to analyze the interference oscillation observed in X-ray total external reflection from thin films and the peak position in Fourier space was in good agreement with the layer thickness, and was determined independently from the surface/interface roughness.
Abstract: Interference oscillation observed in X-ray total external reflection from thin films was analyzed by the Fourier transform algorithm. The peak position in Fourier space was in good agreement with the layer thickness, and was determined independently from the surface/interface roughness. The principle of the present technique and its application to SiO2/Si thin films are shown. The advantages of the experiments using tunable synchrotron X-rays are also discussed.
46 citations