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Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.


Papers
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Journal ArticleDOI
TL;DR: In this paper, the guiding of an attosecond (as) X-ray pulse in a two-dimensional atomic structure is analyzed, and the results obtained from a simple model show that an atomic-scale waveguide which consists of a barium monoxide lattice where five rows of atoms have been removed can successfully guide pulses with duration 20 as and wavelength 10 A.
Abstract: The guiding of an attosecond (as) X-ray pulse in a two-dimensional atomic structure is analyzed. The results obtained from a simple model show that an atomic-scale waveguide which consists of a barium monoxide lattice where five rows of atoms have been removed can successfully guide pulses with duration 20 as and wavelength 10 A. This is attributed to an improved total external reflection in the discrete atomic structure. When the carrier frequency is higher than the plasma frequency, the guide causes minor distortions in the pulse profile. For lower frequencies, the X-ray pulse is significantly affected by the guide dispersion. These results indicate that nano- and sub-nanostructures can be designed for transportation and processing of coherent attosecond-duration electromagnetic pulses, which is important for the newly emerging field of X-ray photonics.

1 citations

Journal Article
TL;DR: In this paper, the authors analyzed the angle of refraction at total optical reflection and showed that the real part is equal to π/2, and the imaginary part determines the decaying constant of evanescent wave in the optically thinner medium.
Abstract: The angle of refraction at total optical reflection is analyzed. It is shown that this angle is a complex. The real part is equal to π/2, and the imaginary part determines the decaying constant of evanescent wave in the optically thinner medium. The Snell's law is expressed in terms of the imaginary part of the refraction angle. The dual form of Snell's law is then given for the incidence angle less than the critical angle.

1 citations

Patent
28 May 1997
TL;DR: In this article, the profile dimensions of the reflection grid, together with the variable refraction, are chosen so that the transversal restriction of the radiation field in the resonator in the working points can be reduced, due to a reflection grid.
Abstract: The resonator houses at least one optical element with variable refraction, at least one active medium, and an apodised optical component (reflection grating). In the operation range the resonator is stable. The profile dimensions of the reflection grid, together with the variable refraction, are so chosen that the transversal restriction of the radiation field in the resonator in the working points can be reduced, due to the reflection grid. Preferably the variable refraction is caused by a thermal lens of the active medium.

1 citations

Journal ArticleDOI
TL;DR: In this paper, the optimum resonance monochromatization of synchrotron radiation by means of grazing-incidence antireflection mirrors is obtained not at the maximum possible enrichment (∼100%) but rather with a low enrichment in the Mossbauer isotope (the natural abundance in the case of iron).
Abstract: It is shown theoretically that the optimum resonance monochromatization of synchrotron radiation by means of grazing-incidence antireflection mirrors is obtained not at the maximum possible enrichment (∼100%) but rather with a low enrichment in the Mossbauer isotope (the natural abundance in the case of iron) This possibility is due to the fact that the conditions of interferometric suppression of electron reflection in the range of total external reflection angles is uniquely sensitive to small variations of the film or substrate density

1 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20224
20214
20206
20198
20189
201710