Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.

High input power laser device

Abstract: A laser device for generating high input power by minimization of surface flection losses between adjacent elements of the device. A laser medium having an index of refraction substantially greater than 1.5 is fluid cooled in a sealed tube by an optically clear cooling medium having a substantially lower refractive index. The indices of the laser and cooling mediums are matched to each other by thin film coatings of index matching material attached to the laser medium, each coating having a thickness of one quarter of the lasing wavelength.

Front light module

Abstract: A front light module, including: a light source; a light guide plate, having a first refractive index and having a side face neighboring the light source; a medium layer, placed over the light guide plate and having a second refractive index, wherein the second refractive index is smaller than the first refractive index; a transparent material layer, placed over the medium layer; and a transparent glue layer, placed under the light guide plate and having a third refractive index, wherein the third refractive index is larger than the refractive index of air and smaller than or equal to the first refractive index.

Grazing-incidence x-ray photoemission spectroscopy investigation of oxidized GaAs(100): A novel approach to nondestructive depth profiling

Abstract: When a beam of x rays (∼1 keV) impinges on a flat surface at grazing angles (≲3°) the x rays undergo total external reflection Under these conditions, the penetration depth of the x rays can become comparable to photoelectron escape depths and the photoelectron yields from the surface are enhanced As the incidence angle of the x rays is increased, the x‐ray penetration depth increases and the photoelectron yields contain a larger contribution from deeper layers within the sample By exploiting this depth‐dependence of photoelectron yields as a function of incident x‐ray beam angle, it is possible to obtain information about the depth distribution of the photoelectron emitting atoms We have used this novel application of grazing‐incidence x‐ray photoelectron spectroscopy (GIXPS) to study the ultraviolet oxidized GaAs(100) surface This oxide/GaAs surface is particularly well suited for study with GIXPS because a variety of oxide phases are formed during oxidation and questions concerning stratification of these phases can be addressed Much insight into the composition and depth‐dependence of these oxide phases can be obtained by directly comparing the spectra collected at different x‐ray incidence angles

Experimental Study on Higher Order Reflection by Monodomain Cholesteric Liquid Crystals

Abstract: Reflection spectra have been measured in the spectral region of the second and the third order selective reflections for monodomain cholesterics of various cell thicknesses at various angles of incidence. Thicker cells give rise to higher reflectance at larger angles of incidence. The second order reflection region consists of three bands which show characteristic polarization correlation: The central band is a total reflection band, where incident light of any polarization is reflected. The reflected light is a polarized when it polarized light is incident and vice versa. Contrary to the central band, two side bands are selectively reflected; σ(π) polarized light is reflected in the longer (shorter) wavelength band retaining its polarization. The third order reflection bands observed for the first time have been found to give the same polarization characteristics as that of the second order reflection bands.

The reality of negative refraction

Abstract: One of the most fundamental phenomena in optics is refraction. When a beam of light crosses the interface between two different materials, its path is altered depending on the difference in the refractive indices of the materials. The greater the difference, the greater the refraction of the beam. For all known naturally occurring materials the refractive index assumes only positive values. But does this have to be the case?