Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
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TL;DR: In this article, an array of reflection zone plates was tested as a wavelength-dispersive fluorescence spectrometer for soft X-rays in the energy range of 100 −550 eV.
17 citations
TL;DR: An experimental study of the durability of extreme UV optical coatings to a large number of free-electron laser pulses is reported.
Abstract: The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of pulses up to 16 million shots and various fluence levels below 10% of the single-shot damage threshold. The experiment was performed at FLASH, the Free-electron LASer in Hamburg, using 13.5 nm extreme UV (EUV) radiation with 100 fs pulse duration. Polycrystalline ruthenium and amorphous carbon 50 nm thin films on silicon substrates were tested at total external reflection angles of 20° and 10° grazing incidence, respectively. Mo/Si periodical multilayer structures were tested in the Bragg reflection condition at 16° off-normal angle of incidence. The exposed areas were analysed post-mortem using differential contrast visible light microscopy, EUV reflectivity mapping and scanning X-ray photoelectron spectroscopy. The analysis revealed that Ru and Mo/Si coatings exposed to the highest dose and fluence level show a few per cent drop in their EUV reflectivity, which is explained by EUV-induced oxidation of the surface.
17 citations
TL;DR: In this paper, the spatial shift of the intensity profile of the totally reflected beam was determined by determining the spatial displacement of a light beam on total internal reflection, and the results can be explained solely on classical grounds.
17 citations
TL;DR: In this article, the authors demonstrate a diffraction geometry which provides strong sensitivity to the microstructure of thin films, while a coherent beam of x rays is being reflected from the surface of the sample, measurements were made of the scattering of the exit beam below the critical angle for total external reflection.
Abstract: We demonstrate a diffraction geometry which provides strong sensitivity to the microstructure of thin films. While a coherent beam of x rays is being reflected from the surface of the sample, measurements were made of the scattering of the exit beam below the critical angle for total external reflection. This results in a strong signal with speckle modulations that are characteristic of the internal arrangement of grains at different depths within the film.
17 citations
TL;DR: In this article, a plano-concave grating lens is demonstrated to focus plane microwaves to a point image, which can be used to achieve negative refraction even though the bulk material has a positive refractive index.
Abstract: Refraction at a smooth interface is accompanied by momentum transfer normal to the interface. We show that corrugating an initially smooth, totally reflecting, non-metallic interface provides a momentum kick parallel to the surface, which can be used to refract light negatively or positively. This new mechanism of negative refraction is demonstrated by visible light and microwave experiments on grisms (grating-prisms). Single-beam all-angle-negative-refraction is achieved by incorporating a surface grating on a flat multilayered material. This negative refraction mechanism is used to create a new optical device, a grating lens. A plano-concave grating lens is demonstrated to focus plane microwaves to a point image. These results show that customized surface engineering can be used to achieve negative refraction even though the bulk material has positive refractive index. The surface periodicity provides a tunable parameter to control beam propagation leading to novel optical and microwave devices.
17 citations