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Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.


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Journal ArticleDOI
TL;DR: It is shown that, under certain conditions, oblique incidence on the entrance face of total internal reflection phase retarders can greatly improve the achromaticity.
Abstract: Results for three λ/4 phase retarders are reported. One of them is achromatic to within ±0.06° of 90° in the visible region. It is shown that, under certain conditions, oblique incidence on the entrance face of total internal reflection phase retarders can greatly improve the achromaticity.

14 citations

Journal ArticleDOI
TL;DR: In this article, the surface morphology of thin bilayer polymer films on top of glass substrates was investigated, which consists of a blend film of protonated and deuterated polystyrene and an underlying deuterelated poly styrene film.
Abstract: The surface morphology of thin bilayer polymer films on top of glass substrates was investigated. The bilayer consists of a blend film of protonated and deuterated polystyrene and an underlying deuterated polystyrene film. Choosing the thickness of the top film larger than 8 times and smaller than 2 times the radius of gyration of the chains enables the determination of film thickness and confinement effects. With diffuse neutron scattering at grazing incidence in the region of total external reflection, a depth sensitivity and a contrast even at the internal polymer-polymer interface was achieved. The underlying film is conformal to the substrate, and depending on the thickness of the top film two different types of roughness correlations are observed. Thin confined films nestle to the underlying polymer films, while the stiffness of thicker bulky films provides an independent morphology. In both cases, annealing above the glass-transition temperature yields an interdiffusion at the internal polymer-polymer interface, and the polymer-air surface remains essentially unchanged with respect to roughness correlations.

14 citations

Journal ArticleDOI
TL;DR: A microchannel plate (MCP) detector blank has been used to focus x rays of 0.154, 0.62, and 0.84-nm wavelength generated by a microfocus x-ray tube and a laser-produced plasma, and a reliable model gives a reliable description of the data.
Abstract: A microchannel plate (MCP) detector blank has been used to focus x rays of 0.154-, 0.62-, and 0.84-nm wavelength generated by a microfocus x-ray tube and a laser-produced plasma. The focusing effect of MCP’s arises from total external reflection of x rays at the interior channel surfaces. Measurements of the intensity profiles of the images formed by the MCP have been made and compared with the predictions of a detailed model developed in Part I. [Appl. Opt. 32, 6316 (1993)]. It was found that the model gives a reliable description of the data. A consistent set of parameters was found from fits to the data at all three wavelengths.

14 citations

Journal ArticleDOI
TL;DR: In this article, the authors developed numerical models for thermal emission in a two-dimensional semitransparent graded-index medium, and two piecewise continuous refractive index models, the bar model and the slab model, were presented.
Abstract: This study develops numerical models for thermal emission in a two-dimensional semitransparent graded-index medium. Two piecewise continuous refractive index models, the bar model and the slab model, are presented. The formal is a combination of rectangular bars each having its own unique refractive index. The latter is a combination of slabs, each of which has a linear refractive index distribution. Two interface hypotheses are discussed: the reflection/refraction hypothesis and the refraction/total reflection hypothesis. The backward ray tracing method and the backward Monte Carlo method are employed for calculation. The apparent directional emissivity of a semitransparent medium with linear and nonlinear refractive index distributions is calculated. The results show that piecewise continuous refractive index can be used for modeling semitransparent media with continuously variable refractive index. Emission from the medium is complex and quite different from a medium with a constant refractive index, when the absorption coefficient is small and/or the refractive index varies greatly in the medium. The refractive/totally reflective inner interface in the bar model gives a more precise emission distribution and can be extended to simulate emission from a medium with a complex three-dimensional refractive index distribution.

14 citations

Patent
27 Dec 1982
TL;DR: In this article, the phase, amplitude or both phase and amplitude of the reflected light can be modulated by thermally induced changes in the first index of refraction, and a method of modulating a first optical beam with a second optical beam is also provided.
Abstract: An optical imaging device includes an optical device comprising means for absorbing at least one wavelength of light incident thereupon, a first layer of a first material having a first index of refraction and being in thermal contact with the absorbing means, and a second layer of a second material having a second index of refraction which is larger than the first index of refraction and which forms an interface with the first layer. The first layer is placed between the absorbing means and the second layer. The phase, amplitude or both phase and amplitude of the reflected light can be modulated by thermally induced changes in the first index of refraction. A method of modulating a first optical beam with a second optical beam is also provided.

14 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20224
20214
20206
20198
20189
201710