Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
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TL;DR: In this article, an electric Hertz dipole that is located in air and directed parallel to a plane interface is considered as the point source, and it is rigorously shown that the electromagnetic radiation propagated from the dipole into the medium with the negative refractive index is focused within a certain region in this medium.
Abstract: Refraction of an electromagnetic wave from a point source to a medium with a negative refractive index is considered. An electric Hertz dipole that is located in air and directed parallel to a plane interface is considered as the point source. It is rigorously shown that the electromagnetic radiation propagated from the dipole into the medium with the negative refractive index is focused within a certain region in this medium. The sizes of the focusing region are determined. As a result, it is pointed out that the diffraction limit cannot be overcome by using homogeneous materials with negative refractive indices.
12 citations
TL;DR: In this article, a technique of measuring the refractive index of a plane parallel test plate has been investigated and further developed, which can be obtained by measuring the optical-path differences introduced between a ray through and a reference beam outside the plate by two successive rotations, which change the angle of incidence.
Abstract: A technique of measuring the refractive index of a plane parallel test plate has been investigated and further developed. The refractive index of the test plate, referred to that of the surrounding medium, can be obtained by measuring the optical-path differences introduced between a ray through and a reference beam outside the plate by two successive rotations, which change the angle of incidence. Close parallelism between the polished surfaces of the test plate is not required but one of the surfaces must be of good optical quality. The index of refraction, relative to that of the surrounding medium, may be calculated without knowledge of the thickness of the plate or of the wavelength of the light Two series of measurements show that the accuracy of the refractive index of a fused-quartz plate, relative to that of surrounding air, is better than 4×10−6. If the same plate is immersed in water, the accuracy turns out to be about 1×10−6. These results were obtained with a commercially available goniometer, used as the angle-recording instrument. This is the part of the equipment that largely determines the accuracy of the index of refraction.
12 citations
TL;DR: In this article, a lamellar multilayer grating of the nominal normal and lateral periods 8 and 800 nm, respectively, was obtained by etching a planar amorphous W/Si multi-layer up to the substrate.
Abstract: A lamellar multilayer grating of the nominal normal and lateral periods 8 and 800 nm, respectively, was obtained by etching a planar amorphous W/Si multilayer up to the substrate. The specular reflectivity, grating truncation rods of nonzero orders, and a reciprocal space map of the scattered intensity close to the total external reflection were measured using the Cu Kα radiation. We demonstrate an extraction of real structural parameters of a fully etched periodic multilayer grating from fitting the measured truncation rods based on the matrix modal eigenvalue approach to the dynamical theory of reflectivity by gratings.
12 citations
TL;DR: In this article, the in-plane structure of the liquid surface yields a peak in the diffuse scattering at the specular position, and the data were analyzed simultaneously, which leads to a consistent set of interface parameters.
Abstract: X-ray diffraction measurements within the region of total external reflection from a thin wetting film of liquid CCl4 on a Si/SiO2 substrate are presented. The in-plane structure of the liquid surface yields a peak in the diffuse scattering at the specular position. Since there is no way to separate specular and off-specular contributions, the data were analysed simultaneously, which leads to a consistent set of interface parameters. Although the obtained power spectral density function of the liquid surface is very similar to that used in the case of free capillary waves, a modified cut-off has to be introduced. The difference results from the constrained thin-film geometry and is therefore caused by the interaction with the underlying substrate.
12 citations
TL;DR: In this article, the complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by multi-angle reflectance of synchrotron radiation.
Abstract: The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by multi-angle reflectance of synchrotron radiation. The resulting index of refraction is higher resolution than previously measured values. It reveals new structures attributed to transitions from the 3d-core orbitals to the Σ5,2c and the X5,2c conduction bands. Additionally, it is shown that the problem of total external reflection, which renders multi-angle reflectance measurements insensitive to the complex-valued refractive index at grazing incidence, can be overcome by employing measurements at angles of incidence away from the critical angle.
12 citations