Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
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Patent•
29 Mar 2003
TL;DR: The first and second long sides (5, 11) are shaped to split light passing through the entry surface into two or more light beams (16, 21, 23, 26) as discussed by the authors.
Abstract: The first and second long sides (5, 11) are shaped to split light passing through the entry surface (13) into two or more light beams (16, 21, 23, 26). The first beam (16) undergoes successive total internal reflection at two surfaces (17, 19). It leaves the optical conductor (2, 34) at the exit surface (5). A second beam (21), only undergoes refraction at the first long side (5). Additionally or alternatively, a third light beam (23) undergoes total internal reflection at a side of the optical conductor facing the source, to leave via the exit surface (5).
8 citations
Journal Article•
TL;DR: In this article, the general reflection and refraction laws at the metasurface with the abrupt phase shift are derived by the two methods based on Fermat's principle and the boundary conditions of continuity, respectively.
Abstract: Considering the abrupt phase shift at the interface between the two media,the general reflection and refraction laws at the metasurface with the abrupt phase shift are derived by the two methods based on Fermat's principle and the boundary conditions of continuity,respectively.It is found that the tradition reflection and refraction laws are the special cases of the generalized reflection and refraction laws when the phase shift gradient is equal to zero.Based on the generalized laws of reflection and refraction,the occurrence conditions of the total internal reflection and the full transmission are given and the effect of the refraction index and the phase shift gradient are discussed.It is shown that the arbitrary controlling of the electromagnetic waves can be easily achieved.
8 citations
TL;DR: Quantitative phase contrast and pure absorption imaging are demonstrated using this method, based on total external reflection from the edge of a mirror, aligned to intercept only half of the incident beam.
Abstract: A novel approach for hard x-ray phase contrast imaging with a laboratory source is reported. The technique is based on total external reflection from the edge of a mirror, aligned to intercept only half of the incident beam. The mirror edge thus produces two beams. The refraction x-rays undergo when interacting with a sample placed before the mirror, causes relative intensity variations between direct and reflected beams. Quantitative phase contrast and pure absorption imaging are demonstrated using this method.
8 citations
TL;DR: In this article, a transition from a symmetric to an asymmetric waveguide can serve as a mode and polarization-dependent light-wave coupler and total reflection occurs at the transition if the angle of incidence of the guided wave exceeds a critical value.
Abstract: A transition from a symmetric to an asymmetric waveguide can serve as a mode‐ and polarization‐dependent light‐wave coupler. Coupling experiments with an efficiency up to 70% are reported. Furthermore, total reflection occurs at the transition if the angle of incidence of the guided wave exceeds a critical value. Coupling and total reflection are explained, using the concept of the effective refractive index.
8 citations
TL;DR: In this paper, the authors developed a technique to determine local density profiles in conformally rough thin films and multilayers for which conventional reflectometry does not work. But this technique is limited to situations where the kinematic Born approximation is sufficient to describe the scattering process.
Abstract: We develop a technique to determine local density profiles in conformally rough thin films and multilayers for which conventional reflectometry does not work. The main idea is to integrate the total scattered intensity for a given vertical momentum transfer over the parallel momentum transfer. Probing Fourier space globally results in a local probe in real space and the integrated intensity is proportional to the local reflectivity of the surface. We also discuss the influence of a finite range of integration as well as sample inhomogeneities, such as nonconformity of the roughness. This technique is limited to situations where the kinematic Born approximation is sufficient to describe the scattering process. However, in certain cases, the technique can be used in the vicinity of the critical angle of total external reflection as well.
8 citations