Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
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01 Jan 2004
TL;DR: In this article, the thickness of a thin layer can be determined from the angular positions of the subsidiary maxima on the reflection (or diffraction) curves, which can be solved both by X-ray reflection and x-ray diffraction.
Abstract: The measurement of layer thickness is a basic problem, and can be solved both by x-ray reflection and x-ray diffraction (see [121] for a review). In both methods, the thickness of a thin layer can be determined from the angular positions of the subsidiary maxima on the reflection (or diffraction) curves.
5 citations
TL;DR: In this paper, the analytic expressions for the four critical angles from which each refracted wave no more exists as propagating wave are presented, and the variation in these critical angles for different interfaces varying the orientation of the incidence plane with respect to the optical axes.
5 citations
01 Dec 2008
TL;DR: In this paper, an artificial surface with asymmetric reflection properties is presented, where a metal ground plane is covered with periodic metal-dielectric composite textures to alter the reflection properties.
Abstract: An artificial surface with asymmetric reflection properties is presented. By covering a metal ground plane with periodic metal-dielectric composite textures, the electromagnetic reflection properties can be altered. By tuning the individual lattice of a periodic mushroom-type texture to vary the surface impedance, a surface with graded reflection phases as a function of position can be designed. Applying a linear gradient in the reflection coefficient phase along the face, the proposed surface is electromagnetically inclined, even though physically flat. For the whole ranges of the incident angle, this metasurface reveals asymmetric reflection properties contrary to the law of reflection. The reflection patterns from the surface, the boundary condition, and the relation between the incident angle and the reflection angle are presented.
5 citations
TL;DR: In this paper, an anisotropy in the dot spacing was found, which proves an ordering of the islands in a disordered two-dimensional square lattice with main axes parallel to the direction and a lateral lattice parameter of 55 nm.
Abstract: We have investigated multiple layers of self-assembled InGaAs quantum dots by high-resolution X-ray diffraction reciprocal space mapping and reflectivity. An anisotropy in the dot spacing was found, which proves an ordering of the islands in a disordered two-dimensional square lattice with main axes parallel to the direction and a lateral lattice parameter of 55 nm. Vertical correlations in the dot multilayers were investigated nondestructively in the regime of total external reflection of X-rays.
5 citations
TL;DR: In this paper, the reflection of X-rays from solid surfaces is comprehensively studied using the measurements of patterns of total external reflection and X-ray diffraction with the aid of a parabolic mirror.
Abstract: The reflection of X-rays from solid surfaces is comprehensively studied using the measurements of patterns of total external reflection and X-ray diffraction with the aid of a parabolic mirror. Principles for theoretical processing of X-ray patterns are developed. An inverse dependence of the refractive index of X-ray radiation on the interplanar distances in crystallites is obtained.
5 citations