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Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.


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TL;DR: In this article, a different use of polycapillary optics is presented to achieve an efficient radiation collimation due to handled beam profiling that avoids the typical one based on total external reflection into the capillary channel, where a vibration is applied to a monocapillary in order to emulate a virtual roughness on the channel internal wall surface.
Abstract: A novel study on a different use of polycapillary optics is presented. The scope of this study is to achieve an efficient radiation collimation due to handled beam profiling that avoids the typical one based on total external reflection into the capillary channel. For this purpose a vibration is applied to a monocapillary in order to emulate a “virtual roughness” on the channel internal wall surface. The transmission properties of such a system for different vibrational states are discussed.

5 citations

Journal ArticleDOI
TL;DR: In this paper, the propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated.
Abstract: The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction can be implemented in certain regions by changing the external magnetic field, wave frequency, and thickness of the layers forming the structure. By varying the above-mentioned characteristics, one can efficiently control the conical refraction parameters; in particular, the opening angles of the cone of internal and external conical refraction and the inclination of the optical axes with respect to the periodicity axis can be varied in a wide range. The results of this study may be useful for designing millimeter-wave, submillimeter-wave, and IR devices.

5 citations

Journal ArticleDOI
TL;DR: This work studies the anomalous negative refraction when a plane wave is incident from an isotropic medium to a uniaxial absorbing medium and the influence of the anisotropy on the refractive indices and the absorption coefficients in thenegative refraction of these materials.
Abstract: In this work we study the anomalous negative refraction when a plane wave is incident from an isotropic medium to a uniaxial absorbing medium. We study the influence of the anisotropy on the refractive indices and the anisotropy on the absorption coefficients in the negative refraction of these materials. Negative refraction can occur for the ordinary and extraordinary waves for a wide range of values of the angle of incidence. The allowed values of the angle of incidence that lead to negative refraction are analyzed in detail as a function of the orientation of the optic axis and the values of the refractive indices and absorption coefficients.

5 citations

Journal ArticleDOI
TL;DR: In this article, an experimental setup for the study of ultra-small angle scattering of up to 13 MeV γ-rays from macroscopically smooth surface has been constructed.
Abstract: Based on the microtron MT-22C an experimental setup for the study of ultra-small angle scattering of up to 13 MeV γ-rays from macroscopically smooth surface has been constructed. Preliminary results for angular distributions and γ-spectra are presented.

5 citations

Journal ArticleDOI
TL;DR: X-ray absorption fine structure (XAFS) measurements done under standing wave conditions have sufficient depth resolution in order to differentiate the center of the Fe layer from the interfacial region as discussed by the authors.
Abstract: X-ray standing waves generated using total external reflection from Au buffer layer has been used to get information about the structure of the interfaces in a Tb∕Fe∕Tb trilayer. X-ray absorption fine structure (XAFS) measurements done under standing wave conditions have sufficient depth resolution in order to differentiate the center of the Fe layer from the interfacial region. XAFS measurements are done in two geometries, with plane of polarization of the incident x-ray lying either in the film plane or perpendicular to it. In these two geometries information is obtained about the bonds lying in the film plane or perpendicular to it, respectively. These measurements provide clear evidence that Fe–Tb bonds in the interfacial region lie preferentially normal to the film plane. This asymmetry of Fe–Tb bonds is the cause of perpendicular magnetic anisotropy in the system. Present studies demonstrate that use of x-ray standing waves can provide sufficient depth resolution in order to elucidate the interface ...

5 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20224
20214
20206
20198
20189
201710