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Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.


Papers
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Journal ArticleDOI
TL;DR: In this paper, the Bragg resonance was used to simulate the reflection of a weak probe radiation pulse from a refractive index lattice induced in a nonlinear medium by intense pulses and that moves in it.
Abstract: Reflection of a weak (probe) radiation pulse from a refractive index lattice that is induced in a non-linear medium by intense pulses and that moves in it is simulated numerically. The possibility of a significant increase in the reflection coefficient (as compared to the case of single inhomogeneity of the refractive index) under the conditions of the Bragg resonance is verified.

5 citations

Patent
19 Jul 1996
TL;DR: In this paper, the authors proposed to set the optical fiber diameter and layout of optical fibers of an optical fiber array so that the accuracy Δn of a refractive index measured on the basis of a total reflexcion critical angle is Δn.
Abstract: PROBLEM TO BE SOLVED: To provide a total reflection type refractive index sensor compact, best suited to measure a refractive index of high temperature liquid and capable of measuring a refractive index with high accuracy. SOLUTION: The emission surface 9 of a wave guide layer and a photo detector 16 are connected by an optical fiber array 12. Totally reflected light from the contact face 8 between a testee M and the wave guide layer is detected by the photodetector 16. It is desirable to set the optical fiber diameter and layout of optical fibers of the optical fiber array 12 so that the accuracy Δn of a refractive index measured on the basis of a total reflexcion critical angle is Δn .

5 citations

Journal Article
TL;DR: In this article, a simple three term nonlinear model was derived from the one developed for the visible region for the index of refraction of water was reviewed and reduced to wavelength dependent formulas.
Abstract: Models for the index of refraction of water are reviewed and reduced to wavelength dependent formulas.A simple three term nonlinear model was derived from the one developed for the visible region.The available data will over an extended range covering the UV to the near-IR(200-1100nm).

5 citations

Journal ArticleDOI
TL;DR: The high sensitivity of the change in the interference pattern with respect to small changes in the refractive index in the vicinity of the critical angle is theoretically proved and experimentally confirmed.
Abstract: An interferometer is investigated in which the interacting beams undergo total internal reflection from a boundary surface with a variable relative refractive index. The high sensitivity of the change in the interference pattern with respect to small changes in the refractive index in the vicinity of the critical angle is theoretically proved and experimentally confirmed.

5 citations

Patent
Wolfgang Neuberger1
04 Mar 1996
TL;DR: The volume fraction of voids required to eliminate the Fresnel reflection losses, v 1, is: v 1 = [n 2 -(n m n 2 ) 1/2 ]/[n 2 −n 1 ], where n 2 is the refractive index of the void, n m is the medium surrounding the fiber tip, and v 2 is its volume fraction in the modified surface section as mentioned in this paper.
Abstract: An interface between a surface of a micro optical component, and a second medium of different refractive index can be made substantially non-reflective, thereby eliminating Fresnel reflection losses for a predetermined wavelength at its surfaces, by including micro voids within the component surface. The volume fraction of voids required to eliminate the Fresnel reflection losses, v 1 , is: v 1 =[n 2 -(n m n 2 ) 1/2 ]/[n 2 -n 1 ], where n 1 is the refractive index of the void, n m is the refractive index of the medium surrounding the fiber tip, n 2 is the refractive index of the optical component material, and v 2 is its volume fraction in the modified surface section. The thickness, t, of the layer of lower refractive index material required at the component surface is 2N t cos θ=λ o /2, where λ o is the predetermined wavelength for total cancellation by interference, θ is the angle of incidence, and N=(n m n 2 ) 1/2 , where n 2 , is the refractive index of the component material and n m is the refractive index of the medium in contact with the component surface. At least one dimension of the micro void in the surface plane interfacing the second medium must be not greater than half the predetermined wavelength.

5 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20224
20214
20206
20198
20189
201710