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Total external reflection

About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.


Papers
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Journal ArticleDOI
S. F. Cui, Z. H. Mai, L. S. Wu, C. Y. Wang, D. Y. Dai 
TL;DR: In this article, a new scheme for x-ray grazing incidence diffraction (GID) under total external reflection conditions is presented, which allows the grazing angles and the scattering angles to be adjusted independently so that the structural and/or the chemical profiles of materials can be determined at controlled depths.
Abstract: A new scheme for x‐ray grazing incidence diffraction (GID) under total external reflection conditions is presented. This simple scheme allows the grazing angles and the scattering angles to be adjusted independently so that the structural and/or the chemical profiles of materials can be determined at controlled depths. As an example, Si1−xGex/Si superlattice materials were studied. Both commensurate and incommensurate growths between the two quantum wells in the strained‐layer superlattice were observed by the GID technique.

4 citations

Patent
17 Aug 2012
TL;DR: In this paper, a method for determining the size d of a transparent particle is proposed, in which the particle is illuminated with light from a light source, a radiation detector measures a time-resolved intensity profile of light of the light source scattered by the particle, a reflection peak (10) and a refraction peak (12) are determined in the intensity profile and the size of the particle d is determined based on a time difference between the reflection peaks (10 and the refraction peaks (12).
Abstract: The invention relates to a method for determining the size d of a transparent particle, according to which method the particle is illuminated with light from a light source, a radiation detector measures a time-resolved intensity profile of light of the light source scattered by the particle, a reflection peak (10) and a refraction peak are determined in the intensity profile and the size d of the particle is determined based on a time difference between the reflection peak (10) and the refraction peak. The method according to the invention is characterized in that the time-resolved intensity profile is measured at a definable scattering angle θ s , a first second-order refraction peak (11) and a second second-order refraction peak (12) having a mode different from that of the first refraction peak (11) being determined, a characteristic variable γ being determined as the ratio of a first time difference Δt 01 between the reflection peak (10) and the first refraction peak (11) and of a second time difference Δt 02 between the reflection peak (10) and the second refraction peak (11), and the size of only those particles being determined for which the characteristic variable γ corresponds to a definable value.

4 citations

Journal ArticleDOI
TL;DR: In this paper, the authors derived explicit expressions for reflection and transmission matrices for a chiral slab, where the diagonal terms of the linearly polarized reflection coefficient matrix are the familiar Fresnel reflection coefficients, and the off-diagonal, cross-polarized reflection coefficients are proportional to the chiral parameter and the product of the vertically and horizontally polarized transmission coefficients of the non-chiral host medium.
Abstract: Inclusions embedded in conventional positive refractive index materials are used to fabricate artificial materials, with negative permittivity, permeability and negative refractive index (NRI). We consider electromagnetic wave propagation in NRI materials with chiral properties that are not negligible. To this end we initially derive explicit expressions for reflection and transmission matrices for a chiral slab. The diagonal terms of the linearly polarized reflection coefficient matrix are the familiar Fresnel reflection coefficients, and the off-diagonal, cross-polarized reflection coefficients are proportional to the chiral parameter and the product of the vertically and horizontally polarized transmission coefficients of the non-chiral host medium. The-full wave modal expansion of the fields include evanescent and propagating radiation fields, several types of lateral waves associated with the phenomena of total internal "backward" reflection as well as several different surface waves (plasmons). Using NRI materials with chiral properties it is possible to fabricate rectangular slabs that perform as lenses associated with two focal lines at the opposite side of the source. Furthermore, the backward propagating lateral waves could be used to make the chiral metamaterials perform like reflectors.

4 citations

Book ChapterDOI
TL;DR: In this article, the lattice location of dilute alloying additions such as Ta and Zr in Nb3Sn lattice sites has been investigated and it was shown that Ta additions reside predominately in nb lattice site, while Zr is not uniquely located at either Nb or Sn sites, providing information about the temperature dependence of interatomic force constants.
Abstract: X-ray absorption techniques have in recent years been developed into powerful probes of the electronic and structural properties of materials difficult to study by other techniques In particular, the extended x-ray absorption fine structure (EXAFS) technique can be applied to a variety of cryogenic materials Three examples will be used to demonstrate the power of the technique The first is the determination of the lattice location of dilute alloying additions such as Ta and Zr in Nb3Sn The Ta additions are shown to reside predominately in Nb lattice sites, while Zr is not uniquely located at either Nb or Sn sites In addition to structural information, temperature dependent EXAFS studies can be used to determine the rms deviations of atomic bond lengths, providing information about the temperature dependence of interatomic force constants For Nb3Sn deviations are found from simple harmonic behavior at low temperatures which indicate a softening of the Nb-Sn bond strength The final example is the study of interfacial properties in thin film systems This is accomplished by making x-ray absorption measurements under conditions of total external reflection of the incident x-rays As some examples will show this technique has great potential for studying interfacial reactions, a process used in the fabrication of many superconducting materials

4 citations

Journal ArticleDOI
TL;DR: In this article, a method of multiple reflection was devised whereby the reflection coefficients in the two cases could be photometrically compared when the second medium is absorbing, and the results indicated that, for a saturated aqueous solution of potassium permanganate, the solvent is preferentially adsorbed at the surface, giving rise to smaller absorption of the superficial wave than would be expected from measurements of the absorption coefficient in the bulk.
Abstract: In this paper experiments are described which indicate by direct interferometric measurements the distance of penetration of light into the second medium at total reflection. The intensity of the superficial wave is greater in the case when the electric vector of the incident light is in the plane of incidence than when it is perpendicular to this plane, as is required by theory. A method of multiple reflection was devised whereby the reflection coefficients in the two cases could be photometrically compared when the second medium is absorbing. The absorption coefficient and the refractive index of the liquid were measured in layers of the order of 10−3 cm thick and the values compared with the values deduced from the theoretical equations for the reflection coefficients. The results indicate that, for a saturated aqueous solution of potassium permanganate, the solvent is preferentially adsorbed at the surface, giving rise to smaller absorption of the superficial wave than would be expected from measurements of the absorption coefficient in the bulk.

4 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20224
20214
20206
20198
20189
201710