Topic
Total external reflection
About: Total external reflection is a research topic. Over the lifetime, 829 publications have been published within this topic receiving 22213 citations.
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TL;DR: In this article, the reflected and refracted electromagnetic fields for an ideal semi-infinite (half-space) plasma, as well as the reflection coefficient, were computed by using a general procedure based on equations of motion and electromagnetic potentials.
3 citations
TL;DR: In this paper, the model of a conducting surface for calculating the reflection coefficient and phase shift of light reflected from a thin metal film at the interface between two dielectrics under the conditions of frustrated total internal reflection is analyzed.
Abstract: Formulas of the model of a conducting surface for calculating the reflection coefficient and phase shift of light reflected from a thin metal film at the interface between two dielectrics under the conditions of frustrated total internal reflection are analyzed. The effect of additional dielectric layers is discussed.
3 citations
Patent•
JDSU1
TL;DR: In this article, a thermo-optical device to alter the direction and/or intensity of a light beam is described, where a first material in contact with a second material defines an interface there between the two materials.
Abstract: A thermo-optical device to alter the direction and/or intensity of a light beam is described In the thermo-optical device, a first material in contact with a second material defines an interface therebetween The first and second materials have disparate thermo-optical coefficients such that, at a first temperature, the refractive indices of the two materials are the same and, at a second temperature, the refractive index of one material is less than the refractive index of the other material At the first temperature, when the two refractive indices are equal, a light beam incident on the interface is transmitted through the interface without refraction At the second temperature, the light beam propagating through one of the material, if incident on the interface at an appropriate angle, will be reflected off, instead of transmitted through, the interface
3 citations
01 May 2016
TL;DR: A surface structure study of an amorphous Zn-sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique was performed in this article.
Abstract: We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
3 citations
TL;DR: In this article, interference-enhanced frustrated total internal reflection (IEFTIR) is proposed for the case of two similar dielectric slabs separated by a dielectrics gap.
Abstract: When the reflected or transmitted field of a frustrated total internal reflection is returned along its path to the point of incidence, it produces a third auxiliary field. When any combination of two of the three fields is returned along their respective paths to the point of incidence, interference-enhanced frustrated total internal reflection (IEFTIR) occurs. Exact IEFTIR solutions are obtained for the case of two similar dielectric slabs separated by a dielectric gap. The general results include, for both s and p polarizations, the transmitted and reflected fields and the transmission and reflection coefficients for each of three posssible modes. Special features of the solution are discussed regarding fast optical switching and variable transmission/reflection applications.
3 citations