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Transistor laser
About: Transistor laser is a research topic. Over the lifetime, 198 publications have been published within this topic receiving 2917 citations.
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458 citations
TL;DR: In this paper, the authors demonstrate the laser operation of an InGaP-GaAs-InGaAs heterojunction bipolar light-emitting transistor with AlGaAs confining layers and recombination quantum well incorporated in the p-type base region.
Abstract: Data are presented demonstrating the laser operation (quasicontinuous, ∼200K) of an InGaP–GaAs–InGaAs heterojunction bipolar light-emitting transistor with AlGaAs confining layers and an InGaAs recombination quantum well incorporated in the p-type base region Besides the usual spectral narrowing and mode development occurring at laser threshold, the transistor current gain β=ΔIc∕ΔIb in common emitter operation decreases sharply at laser threshold (65→25,β>1)
171 citations
TL;DR: In this article, the InGaP-GaAs heterojunction bipolar transistor laser with AlGaAs optical confining layers and an InGaAs recombination quantum well incorporated into the p-type base region is demonstrated.
Abstract: Continuous wave laser operation at 25°C, with simultaneous electrical gain, of an InGaP–GaAs heterojunction bipolar transistor laser, with AlGaAs optical confining layers and an InGaAs recombination quantum well incorporated into the p-type base region, is demonstrated. At laser threshold (IB=40mA, VCB=0, 25°C), the transistor current gain β=ΔIC∕ΔIB in common-emitter operation changes abruptly (2.3→1.2,β>1), with laser modes developing at wavelength λ∼1006nm. Direct three-port modulation of the transistor laser at 3GHz is demonstrated for a device with a 2.2μm emitter width and a 850μm length between cleaved Fabry–Perot facets (which is the performance of an exploratory device and not near the limits).
158 citations
TL;DR: In this paper, the radiative recombination in the graded base layer of InGaP/GaAs heterojunction bipolar transistors (HBTs) has been observed for a 1 μm×16 μm emitter HBT.
Abstract: This letter reports the direct observation of the radiative recombination in the graded base layer of InGaP/GaAs heterojunction bipolar transistors (HBTs). For a 1 μm×16 μm emitter HBT, we demonstrate the change of the spontaneous light emission intensity (ΔIout) as the base current (Δib) of the HBT is varied from 0 to 5 mA, i.e., an HBT operating as a light-emitting transistor. We also demonstrate output light modulation from the base layer at 1 MHz with the base current modulated at 1 MHz in normal transistor mode operation of the HBT.
134 citations
TL;DR: In this paper, the authors reported enhanced radiative recombination realized by incorporating InGaAs quantum wells in the base layer of light-emitting InGaP/GaAs heterojunction bipolar transistors (LETs) operating in the common-emitter configuration.
Abstract: This letter reports the enhanced radiative recombination realized by incorporating InGaAs quantum wells in the base layer of light-emitting InGaP/GaAs heterojunction bipolar transistors (LETs) operating in the common-emitter configuration. Two 50 A In1−xGaxAs (x=85%) quantum wells (QWs) acting, in effect, as electron capture centers (“traps”) are imbedded in the 300 A GaAs base layer, thus improving (as a “collector” and recombination center) the light emission intensity compared to a similar LET structure without QWs in the base. Gigahertz operation of the QW LET with simultaneously amplified electrical output and an optical output with signal modulation is demonstrated.
120 citations