Trap (computing)

About: Trap (computing) is a research topic. Over the lifetime, 5842 publications have been published within this topic receiving 49384 citations. The topic is also known as: exception & fault.

Angioplasty device and method of making same

Abstract: An angioplasty device and particle trap for use in removal of a particle from a small diameter vessel or vessel-like structure is disclosed. One embodiment includes a catheter for insertion into a vessel-like structure, the catheter having a catheter wall and a movable member, a trap operably connected to the catheter wall and to the movable member, wherein relative motion between the catheter wall and the movable member actuates the trap. In one embodiment, the expanded trap is formed from struts in a spiral-shaped configuration. In one embodiment, the contracted trap forms a waist to creates a pinch-point to trap particles. In one embodiment, the contracted trap forms a cocoon-like structure to further trap particles. In one embodiment, the angioplasty device includes a handle to actuate the trap from a contracted position to an expanded position and return to a contracted position. The handle provides rotational or longitudinal or both types of movement to actuate the trap.

Theory of Isothermal Currents and the Direct Determination of Trap Parameters in Semiconductors and Insulators Containing Arbitrary Trap Distributions

Abstract: Equations are presented that permit the calculation of the isothermal current- (I) vs-time ($t$) characteristics for defect insulators and semiconductors in which the field is sufficiently high and the active region sufficiently thin so that recombination of free carriers is negligible. More important, however, it is shown that by plotting $\mathrm{It}$ vs ${log}_{10}t$ the resulting characteristic is either (a) in the case of distributed traps, a direct image of the trap distribution, or (b) in the case of discrete traps, exhibits a number of sharp maxima at various times, depending on the trap parameters. The technique permits the direct determination of the trap distribution without having to have an a priori knowledge of the trap parameters and without the necessity of laborious analyses.

Analyzing Deception in Trap Functions

Abstract: A flat-population schema analysis is performed to find conditions for full deception in trap functions. It is found that the necessary and sufficient condition for an l-bit fully deceptive trap function is that all order l — 1 schemata are misleading, and it is observed that the trap functions commonly used in a number of test suites are not fully deceptive. Further analysis suggests that in a fully deceptive trap function, the locally optimal function value may be as low as 50% of the globally optimal function value. In this context, the limiting ratio of the locally and the globally optimal function value for a number of fully deceptive functions currently in use are calculated. The analysis indicates that trap functions allow more flexibility in designing a deceptive function. It is also found that the proportion of fully deceptive functions in the family of trap functions is only O(l−1 ln l)) and that more than half of the trap functions are fully easy functions.