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Van der Pauw method

About: Van der Pauw method is a research topic. Over the lifetime, 1682 publications have been published within this topic receiving 25364 citations.


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Journal ArticleDOI
TL;DR: The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.
Abstract: Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.

20 citations

Journal ArticleDOI
TL;DR: In this paper, photo assisted molecular beam epitaxy was used to synthesize thin films of the diluted magnetic semiconductor Cd1−xMnxTe, where In and Sb were used as n and p-type dopants, respectively.
Abstract: The successful substitutional doping of thin films of the diluted magnetic semiconductor Cd1−xMnxTe is discussed. These doped films were prepared using a new technique, photoassisted molecular‐beam epitaxy, in which the substrate is illuminated during film growth. In and Sb were used as n‐ and p‐type dopants, respectively. Cd1−xMnxTe:In–CdTe and Cd1−xMnxTe:Sb–SdTe superlattices were also prepared. The structural, electrical, and optical properties of the samples were studied by means of double‐crystal x‐ray diffraction, van der Pauw Hall‐effect measurements, low‐temperature photoluminescence, and piezoreflectance measurements.

20 citations

Journal ArticleDOI
TL;DR: In this paper, the optical and electrical properties of various transparent conductive oxide (TCO) thin films deposited on insulating ceramics for emerging optoelectronic applications were investigated.

19 citations

Journal ArticleDOI
TL;DR: In this article, the authors interpreted the magnetic structure in terms of a linear chain model, which is based on the theoretical work by Kallel et al. They showed that the magnetic transition at 120 K is due to an antiferromagnetic ordering in the abplane.
Abstract: Susceptibility, resistivity and thermal expansion measurements have been performed on single crystals of FeP. The temperature ranges were 4.2 K-300 K, 15 K-300 K and 95 K-300 K respectively. The susceptibility measurements show a magnetic transition at 120 K, which is due to an antiferromagnetic ordering in the ab-plane. Above TN there is a considerable amount of anisotropy. The susceptibility curves representing the three principal directions have maxima around 220 K. The magnetic structure is interpreted in terms of a linear chain model. This interpretation of the experimental results is based on the theoretical work by Kallel et al. Resistivity measurements, carried out with the van der Pauw method, give an anisotropic resistivity tensor. The resistivity vs. temperature curves have points of inflexion at 115 K. The thermal expansion coefficient of the b-axis is much larger than the coefficients of the other axes.

19 citations

Patent
16 Jun 2009
TL;DR: A van der Pauw (VDP) sensor as discussed by the authors is composed of an electronic circuit coupled to a surface, the surface comprising a type III-V material, and the electronic circuit measuring a sheet resistivity of the surface using a VDP technique.
Abstract: A van der Pauw (VDP) sensor comprising an electronic circuit electrically coupled to a surface, the surface comprising a type III-V material, and the electronic circuit measuring a sheet resistivity of the surface using a VDP technique. The VDP sensor may further comprise a macromolecule, such as a porphyrin, an oligonucleotide, a protein, a polymer or a combination thereof in contact with the surface. The VDP sensors may be arranged in an array of similar or different sensors. An electronic circuit electrically coupled to a type III-V material having a two-dimensional electron gas, such as InAs or InN, the electronic circuit measuring an electrical property of the type III-V material having a two-dimensional electron gas.

19 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202328
202241
202128
202030
201960
201867