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Ichiro Komura

Researcher at Toshiba

Publications -  21
Citations -  203

Ichiro Komura is an academic researcher from Toshiba. The author has contributed to research in topics: Ultrasonic testing & Nondestructive testing. The author has an hindex of 8, co-authored 21 publications receiving 193 citations.

Papers
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Crack detection and sizing technique by ultrasonic and electromagnetic methods

TL;DR: In this paper, a 256-channel array system has been developed for the inspection of weldment of BWR internal components such as core shrouds and the TOFD crack sizing technique also can be applied using this system.
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Depth sizing of partial-contact stress corrosion cracks from ECT signals

TL;DR: In this paper, a crack conductivity independent artificial neural network (ANN) is constructed so that the entire depth profile can be reconstructed regardless of the crack conductivities, and the average depth of each SCC is fast estimated from the DCSF and the detailed depth profile is reconstructed from ANN.
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NDE of a 3-D Surface Crack Using Closely Coupled Probes for DCPD Technique

TL;DR: In this article, a procedure of applying the d-c potential drop technique using the closely coupled probes to NDE of a 3-D surface crack is newly developed, and the calibration equation for three sensors which differ in the distance between the probes is derived.
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Improved ultrasonic testing by phased array technique and its application

TL;DR: In this article, two examples of phased array application were conducted in order to establish the availability of this technique as an actual NDT technique, and it was recognized that both types of scanning mode had the capability for defect detection and successful estimation of the defect size.
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NDE of multiple cracks on the surface of materials by means of the potential drop technique

TL;DR: In this paper, a method is developed to evaluate nondestructively multiple cracks on the surface of materials based on the d.c. potential drop technique, where the distance between the cracks is known.