M
Meera Sampath
Researcher at Xerox
Publications - 42
Citations - 4127
Meera Sampath is an academic researcher from Xerox. The author has contributed to research in topics: Image quality & Controller (computing). The author has an hindex of 18, co-authored 42 publications receiving 3980 citations. Previous affiliations of Meera Sampath include PARC & University of Michigan.
Papers
More filters
Journal ArticleDOI
Diagnosability of discrete-event systems
TL;DR: The approach to failure diagnosis presented in this paper is applicable to systems that fall naturally in the class of DES's; moreover, for the purpose of diagnosis, most continuous variable dynamic systems can be viewed as DES's at a higher level of abstraction.
Journal ArticleDOI
Failure diagnosis using discrete-event models
TL;DR: A discrete-event systems (DES) approach to the failure diagnosis problem is proposed, applicable to systems that fall naturally in the class of DES; moreover, for the purpose of diagnosis, continuous-variable dynamic systems can often be viewed as DES at a higher level of abstraction.
Proceedings ArticleDOI
Failure diagnosis using discrete event models
TL;DR: A discrete event systems (DES) approach to the failure diagnosis problem is proposed and the notion of diagnosability is discussed, and the construction procedure of the diagnoser is presented.
Journal ArticleDOI
Active diagnosis of discrete-event systems
TL;DR: The authors present an iterative procedure for determining the supremal controllable, observable, and diagnosable sublanguage of the legal language and for obtaining the supervisor that synthesizes this language and provide both a controller that ensures diagnosability of the closed-loop system and a diagnoser for online failure diagnosis.
Patent
Systems and methods for failure prediction, diagnosis and remediation using data acquisition and feedback for a distributed electronic system
TL;DR: In this article, real-time failure prediction and diagnoses of electronic systems operating in a network environment can be achieved by using monitoring data, feedback data, and pooling of failure data from a plurality of electronic devices.