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Y. Yamashita
Researcher at Kyushu Institute of Technology
Publications - 2
Citations - 327
Y. Yamashita is an academic researcher from Kyushu Institute of Technology. The author has contributed to research in topics: Fault coverage & Power network design. The author has an hindex of 2, co-authored 2 publications receiving 324 citations.
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Proceedings ArticleDOI
On low-capture-power test generation for scan testing
TL;DR: Experimental results show the effectiveness of the novel low-capture-power X-filling method in reducing capture power dissipation without any impact on area, timing, and fault coverage.
Proceedings ArticleDOI
Low-capture-power test generation for scan-based at-speed testing
Xiaoqing Wen,Y. Yamashita,Shohei Morishima,Seiji Kajihara,Laung-Terng Wang,Kewal K. Saluja,Kozo Kinoshita +6 more
TL;DR: A novel low-capture-power X-filling method of assigning 0's and 1's to unspecified (X) bits in a test cube obtained during ATPG to improve the applicability of scan-based at-speed testing by reducing the risk of test yield loss.