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A. Le Bail
Researcher at Centre national de la recherche scientifique
Publications - 91
Citations - 4221
A. Le Bail is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Crystal structure & Powder diffraction. The author has an hindex of 20, co-authored 91 publications receiving 3934 citations. Previous affiliations of A. Le Bail include University of Maine.
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Ab-initio structure determination of LiSbWO6 by X-ray powder diffraction
TL;DR: In this article, the crystal structure of LiSbWO6 was solved from X-ray powder diffraction data and the structure was refined using Rietveld profile refinement principles.
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Size–strain line-broadening analysis of the ceria round-robin sample
Davor Balzar,Davor Balzar,N. Audebrand,Mark R. Daymond,Andrew N. Fitch,A.W. Hewat,J. I. Langford,A. Le Bail,Daniel Louër,O. Masson,C.N. McCowan,N. C. Popa,Peter W. Stephens,Brian H. Toby +13 more
TL;DR: The results of both a line-broadening study on a ceria sample and a size-strain round robin on diffraction line broadening methods, which was sponsored by the Commission on Powder Diffraction of the International Union of Crystallography, are presented in this paper.
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Monte Carlo indexing with McMaille
TL;DR: A Monte Carlo code for indexing powder diffraction patterns is presented in this article, where cell parameters are generated randomly and tested against an idealized powder profile generated from the extracted d's and I's.
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Modelling the silica glass structure by the Rietveld method
TL;DR: In this paper, a microstrained crystalline model derived from the α-carnegieite structure was used to refine amorphous structures like crystalline ones, and the agreement R χ factors were the best ever obtained with a small-size model built exclusively from [SiO 4 ] tetrahedra linked by corners.
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A new study of the structure of LaNi5D6.7 using a modified Rietveld method for the refinement of neutron powder diffraction data
TL;DR: In this paper, the Rietveld profile analysis method has been extended using a Fourier analysis of line profiles on the basis of the Warren-Averbach method for separating size and strain effects.