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A. S. Muthanantha Murugavel

Researcher at Dr. Mahalingam College of Engineering and Technology

Publications -  9
Citations -  170

A. S. Muthanantha Murugavel is an academic researcher from Dr. Mahalingam College of Engineering and Technology. The author has contributed to research in topics: Support vector machine & Wavelet transform. The author has an hindex of 5, co-authored 8 publications receiving 132 citations.

Papers
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Journal ArticleDOI

Hierarchical multi-class SVM with ELM kernel for epileptic EEG signal classification

TL;DR: The results show that the proposed H-MSVM with ELM kernel is efficient in terms of better classification accuracy at a lesser execution time when compared to ANN, various multi-class SVMs, and other research works which use the same clinical dataset.
Journal ArticleDOI

Epileptic seizure detection using fuzzy-rules-based sub-band specific features and layered multi-class SVM

TL;DR: The proposed LDAG-SVM with fuzzy-rules-based selected sub-band specific features provides better performance in terms of improved classification accuracy with reduced execution time compared to existing methods.
Proceedings ArticleDOI

Lyapunov features based EEG signal classification by multi-class SVM

TL;DR: This research demonstrated that the Lyapunov exponents and Wavelet Coefficients are the features which well represent the EEG signals and the multi-class SVM and PNN trained on these features achieved high classification accuracies such as 96% and 94%.

An Optimized Extreme Learning Machine for Epileptic Seizure Detection

TL;DR: The performance of the proposed OELM with Wavelet based statistical features is better in terms of training time and classification accuracy and needs less training time compared with SVM.
Proceedings ArticleDOI

Combined Seizure Index with Adaptive Multi-Class SVM for epileptic EEG classification

TL;DR: The experimental results show that the adaptive MSVM with wavelet based features which will represent the EEG signals and the classification methods trained on these features achieved high classification accuracies with better false rate and sensitivity.