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Adam Krzyżak

Researcher at Concordia University

Publications -  264
Citations -  8136

Adam Krzyżak is an academic researcher from Concordia University. The author has contributed to research in topics: Support vector machine & Radial basis function network. The author has an hindex of 37, co-authored 244 publications receiving 7631 citations. Previous affiliations of Adam Krzyżak include West Pomeranian University of Technology & Wrocław University of Technology.

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Book ChapterDOI

Application of Pattern Recognition Techniques for the Analysis of Histopathological Images

TL;DR: Application of pattern recognition and image processing to automatic processing and analysis of histopathological images for counting of red and white blood cells using microscopic images of blood smear samples and breast cancer malignancy grading from slides of fine needle aspiration biopsies is discussed.
Journal ArticleDOI

Fixed-design regression estimation based on real and artificial data

TL;DR: This article studies the fixed-design regression estimation based on real and artificial data, where the artificial data comes from previously undertaken similar experiments, and a least-squares estimate that gives different weights to the real and Artificial data is introduced.
Proceedings ArticleDOI

A new geometrical approach for solving the supervised pattern recognition problem

TL;DR: This paper explores the supervised pattern recognition problem based on feature partitioning as an heuristic good clique cover problem satisfying the k-nearest neighbors rule, and the geometrical structure of the training set is utilized in the best possible way.
Proceedings ArticleDOI

Influence of nuclei segmentation on breast cancer malignancy classification

TL;DR: A role of nuclear segmentation from fine needle aspiration biopsy (FNA) slides and its influence on malignancy classification is discussed and level set segmentation yields the best results over the three compared approaches and leads to a good feature extraction with the lowest average error rate.