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Alan David Bennett

Researcher at SanDisk

Publications -  59
Citations -  3315

Alan David Bennett is an academic researcher from SanDisk. The author has contributed to research in topics: Memory map & Block (telecommunications). The author has an hindex of 24, co-authored 59 publications receiving 3315 citations. Previous affiliations of Alan David Bennett include Western Digital.

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Patent

Cyclic flash memory wear leveling

TL;DR: In this paper, a re-programmable nonvolatile memory system, such as a flash EEPROM system, having its memory cells grouped into blocks of cells that are simultaneously erasable is operated in a manner to level out the wear of the individual blocks through repetitive erasing and reprogramming.
Patent

Scheduling of housekeeping operations in flash memory systems

TL;DR: In this article, a re-programmable nonvolatile memory system, such as a flash EEPROM system, having its memory cells grouped into blocks of cells that are simultaneously erasable is operated to perform memory system housekeeping operations in the foreground during execution of a host command.
Patent

Spare block management in non-volatile memories

TL;DR: In this paper, the authors present techniques for the management of spare blocks in re-programmable nonvolatile memory systems, such as a flash EEPROM system, where blocks of one section are more prone to error, while blocks of the other section are less error prone.
Patent

Non-volatile memory and method with non-sequential update block management

TL;DR: In this article, an index of the logical units in a non-sequential update block is buffered in RAM and stored periodically into the non-volatile memory, where the index is stored in the header of each logical unit.
Patent

Adaptive deterministic grouping of blocks into multi-block units

TL;DR: In this article, the linking of physical blocks of a non-volatile memory into composite logical structures or "metablocks" is presented. But the linking is deterministically formed according to an algorithm and can be optimized according to the pattern of any bad blocks in the memory.