A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed in an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. When the maximum variation width of the threshold voltage for memorizing information is larger, since stress to a memory cell owing to a rewrite operation of memory information becomes larger, it is inferior in a point of guaranteeing the number of times of rewrite operation; however, since a read current becomes larger, a read speed of memory information can be expedited. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information and the second nonvolatile memory area can be prioritized in guaranteeing the number of times of rewrite operation of memory information more.

Semiconductor Integrated circuit

A device includes a current source circuit to separately provide a first current and a second current and a thermal detection device coupleable to the output of the current source circuit. The device further includes a voltage detection circuit to provide a first indicator of a first voltage representative of a voltage at the thermal detection device in response to the second current and a second indicator of a second voltage representative of a voltage difference between the voltage at the thermal detection device in response to the second current and a voltage at the voltage detection device in response to the first current. The device further includes a temperature detection circuit to provide an over-temperature indicator based on the first indicator and the second indicator, wherein an operation of a circuit component of the device can be adjusted based on the over-temperature indicator.

Multiple sensor thermal management for electronic devices

A bandgap reference voltage generating circuit includes a proportional to absolute temperature (PTAT) voltage generating means generating a PTAT voltage. A complementary to absolute temperature (CTAT) voltage generating means generates a CTAT voltage. A temperature coefficient determining means interconnects the PTAT voltage generating means and the CTAT voltage generating means.

Low voltage bandgap voltage reference circuit

A bandgap circuit comprising a current generation circuit and a current replication circuit is provided herein. The output current of the current generation circuit is generated as a weighted sum of two currents. The circuit configuration of the current generation circuit allows it to function at low power supply voltages, e.g., on the order of 1 V. The current replication circuit includes an operational amplifier, which when configured in conjunction with MOS cascode current sources and the current generation circuit, significantly increases the accuracy and insensitivity to power supply noise of the bandgap circuit output current. A resistor may be included between the bandgap circuit output node and ground for generating a reference voltage with increased accuracy and insensitivity to power supply noise.

High PSRR, high accuracy, low power supply bandgap circuit

A band-gap reference voltage generator includes a first reference current generator, a second reference current generator, and a reference voltage generator. The first reference current generator includes: a driver generating a first reference current in response to a first voltage signal generated by comparison of the unique voltage and the thermal voltage. The second reference current generator includes a driver generating a second reference current in response to a second voltage signal generated by comparison of a division voltage of a power-supply voltage and the unique voltage. The reference voltage generator includes a driver forming current mirrors in association with each of the first reference current generator and the second reference current generator, respectively, and generating a third reference current and a fourth reference current via the formed current mirrors, and a current-voltage converter converting the sum of the third reference current and the fourth reference current into a reference voltage, and outputting the reference voltage.

Band-gap reference voltage generator

A fast start-up low-voltage bandgap voltage reference circuit is disclosed. The bandgap voltage reference circuit includes: a first current generator, which is implemented by a self-bias unit and a current mirror for generating a first reference current with positive temperature coefficient; a second current generator, which is connected to a point with negative temperature coefficient in the first current generator to generate a second reference current with negative temperature coefficient; and a resistor for converting the first reference current and the second reference current into a low-voltage bandgap voltage independent of temperature. Because the bandgap voltage reference circuit of the invention uses the resistor to convert the first reference current and the second reference current into voltage, the circuit can provide low-voltage bandgap voltage.

Chao-Cheng Lee

Papers

Fast start-up low-voltage bandgap voltage reference circuit