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Chunlin Fu

Researcher at Chongqing University of Science and Technology

Publications -  140
Citations -  1951

Chunlin Fu is an academic researcher from Chongqing University of Science and Technology. The author has contributed to research in topics: Dielectric & Ferroelectricity. The author has an hindex of 19, co-authored 121 publications receiving 1252 citations. Previous affiliations of Chunlin Fu include Taiyuan University of Science and Technology.

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A comparative study on the structural, dielectric and multiferroic properties of Co0.6Cu0.3Zn0.1Fe2O4/Ba0.9Sr0.1Zr0.1Ti0.9O3 composite ceramics

TL;DR: In this article, the effects of molar ratio on the structural, dielectric and multiferroic properties of Co0.6Cu0.3Zn0.1Fe2O4/Ba0.9O3 (CCZFO/BSZTO) composite ceramics were investigated.
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Enhancement of magnetoelectric properties of (1-x)Mn0.5Zn0.5Fe2O4-xBa0.85Sr0.15Ti0.9Hf0.1O3 composite ceramics

TL;DR: In this article, a comparative study of structure, dielectric, ferroelectric, magnetic properties as well as coupling effect for (1-x)Mn0.5Zn 0.5Fe2O4-xBa0.15Ti0.9Hf 0.8
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Vanadium doping effects on microstructure and dielectric properties of barium titanate ceramics

TL;DR: In this article, XRD patterns show that V 5+ ions have entered into the tetragonal perovskite structure of solid solution to substitute for Ti 4+ ions on the B sites.
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Influence of core size on the multiferroic properties of CoFe2O4@BaTiO3 core shell structured composites

TL;DR: In this paper, the effect of core size on the microstructure and multiferroic properties have been systematically studied and the results indicate that with the decrease of the core size, the dielectric, ferroelectric properties as well as the magnetoelectric coupling effect were increased dramatically.
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Photovoltaic enhancement based on improvement of ferroelectric property and band gap in Ti-doped bismuth ferrite thin films

TL;DR: In this article, the effects of titanium on the microstructure, optical, leakage, ferroelectric and photovoltaic characteristics of bismuth ferrite thin films were investigated systematically.