David E. Merry

TL;DR: In this article, a storage subsystem monitors one or more conditions related to the probability of a data error occurring, and adjusts an error correction setting, and thus the quantity of ECC data used to protect data received from a host system.

TL;DR: A non-volatile solid-state storage subsystem, such as a nonvolatile memory device, maintains usage statistics reflective of the wear state, and thus the remaining useful life, of the subsystem's memory array as mentioned in this paper.

TL;DR: In this paper, a storage subsystem includes a variable-size write buffer that temporarily stores write data received from a host system and is capable of adjusting the size of the write buffer so as to vary both the performance (e.g., sustained write speed) of the storage subsystem and a risk of data loss.

TL;DR: A storage subsystem is disclosed that maintains statistics regarding errors detected via an ECC (error correction code) module of the storage subsystem; and/or historical data regarding operating conditions experienced by storage subsystem, such as temperature, altitude, humidity, shock, and input voltage level as discussed by the authors.

TL;DR: In this paper, a memory system comprising one or more memory devices is purged to prevent unauthorized access to data stored therein, and a host system passes control of purge operations to the memory system.