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Dennis J. Andersh
Researcher at Science Applications International Corporation
Publications - 6
Citations - 144
Dennis J. Andersh is an academic researcher from Science Applications International Corporation. The author has contributed to research in topics: Synthetic aperture radar & Radar cross-section. The author has an hindex of 4, co-authored 6 publications receiving 140 citations.
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Proceedings ArticleDOI
Xpatch 4: the next generation in high frequency electromagnetic modeling and simulation software
Dennis J. Andersh,J. Moore,S. Kosanovich,D. Kapp,R. Bhalla,R. Kipp,T. Courtney,A. Nolan,F. German,J. Cook,Jeff A. Hughes +10 more
TL;DR: Xpatch applies the shooting and bouncing ray (SBR) method to realistic 3D targets in order to generate 0D through 3D radar signatures.
Proceedings ArticleDOI
XPATCH: a high-frequency electromagnetic scattering prediction code using shooting and bouncing rays
TL;DR: In this article, an electromagnetic computer prediction code for generating radar cross section (RCS), time domain signatures, and synthetic aperture radar (SAR) images of realistic 3-D vehicles is described.
Proceedings ArticleDOI
Xpatch prediction improvements to support multiple ATR applications
TL;DR: An electromagnetic computer prediction code for generating radar cross section (RCS), time-domain signature sand synthetic aperture radar (SAR) images of realistic 3D vehicles and improvements for millimeter wave applications and hybridization with finite element method for small geometric features are described.
Proceedings ArticleDOI
A fast algorithm for 3D SAR simulation of target and terrain using Xpatch
TL;DR: This paper describes a methodology of modeling 3D SAR images using ray-based high frequency electromagnetic (EM) techniques that have been developed in the past for 2D SAR simulations and will extend on those approaches for modeling 3d SAR images.
Proceedings ArticleDOI
Development of SAR scene modeling tools for ATR performance evaluation
TL;DR: In this article, a 3D terrain model is used to compute local slope, shadowing and layover effects for the synthetic background case and natural clutter returns are modeled from a statistical database derived from measured data.