E
E.L. Petersen
Researcher at United States Naval Research Laboratory
Publications - 7
Citations - 1117
E.L. Petersen is an academic researcher from United States Naval Research Laboratory. The author has contributed to research in topics: Upset & Single event upset. The author has an hindex of 7, co-authored 7 publications receiving 1062 citations.
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Journal ArticleDOI
CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code
Allan J. Tylka,James H. Adams,P.R. Boberg,B. Brownstein,W. F. Dietrich,E. O. Flueckiger,E.L. Petersen,M.A. Shea,D. F. Smart,E.C. Smith +9 more
TL;DR: The Cosmic Ray on Micro-Electronics (CREME) as mentioned in this paper is a suite of programs for creating numerical models of the ionizing-radiation environment in near-Earth orbits and for evaluating radiation effects in spacecraft.
Journal ArticleDOI
Rate prediction for single event effects-a critique
TL;DR: In this article, the authors review various single event effects (SEE) testing and rate prediction methodologies and recommend standard approaches for directionization-induced SEU rate prediction, based partially on a different way of viewing the results of SEU cross-section measurements.
Journal ArticleDOI
Geometrical factors in SEE rate calculations
TL;DR: In this article, a number of possible geometrical effects that may show up in either upset measurements or upset calculations are examined, and an attempt is made to fit these results into a common set of concepts.
Journal ArticleDOI
Displacement damage in GaAs structures
TL;DR: In this article, the energy dependence of the nonionizing energy deposited in GaAs as a result of inelastic interaction with protons over the energy range 10-1000 MeV was investigated.
Proceedings ArticleDOI
Proton irradiation SEU test results for the SEDS MIL-STD-1773 fiber optic data bus: integrated optoelectronics
Kenneth A. LaBel,E.G. Stassinopoulos,P.W. Marshall,E.L. Petersen,C.J. Dale,Christina M. Crabtree,Craig A. Stauffer +6 more
TL;DR: Proton test results for continuing this investigation under actual subsystem interface conditions (MIL-STD-1773) as well as for generic devices using the proton test facilities at University of California, Davis (UCD).