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E. M. Lowry

Researcher at Eastman Kodak Company

Publications -  7
Citations -  358

E. M. Lowry is an academic researcher from Eastman Kodak Company. The author has contributed to research in topics: Spatial frequency & Relative luminance. The author has an hindex of 6, co-authored 7 publications receiving 353 citations.

Papers
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Sine-Wave Response of the Visual System. II. Sine-Wave and Square-Wave Contrast Sensitivity*†

TL;DR: In this article, the authors measured the response of the visual system to sine-wave and square-wave spatial distributions using the threshold criterion of contrast sensitivity, focusing on the low spatial frequencies, a region which is critically important in the mechanism of visual contrast phenomena.
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Sine-wave response of the visual system. I. The Mach phenomenon.

TL;DR: A visual slit photometer has been built with which the subjective intensity distribution may be evaluated directly and the objective and subjective intensity distributions have been combined to yield the sine-wave response of the visual system.
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The Effect of Hue on Dark Adaptation

TL;DR: The writer believes that the reported reduction in time necessary to dark-adapt the eyes by wearing red goggles for a period of approximately 30 minutes is due to the much reduced brightness of the visual field as viewed through the goggles and not to the wave-length region involved.
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An Instrument for the Measurement of the Graininess of Photographic Materials

TL;DR: In this article, the effect of field brightness on graininess has been investigated for a range of brightness values from 6 to 100 millilamberts, and the results showed that constant field brightness has a significant effect on the graininess of different emulsions.