F
F. Meisenkothen
Researcher at Air Force Research Laboratory
Publications - 5
Citations - 705
F. Meisenkothen is an academic researcher from Air Force Research Laboratory. The author has contributed to research in topics: Flux pinning & Magnetic field. The author has an hindex of 2, co-authored 2 publications receiving 666 citations.
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Addition of nanoparticle dispersions to enhance flux pinning of the YBa2Cu3O7-x superconductor
TL;DR: A method for achieving a dispersion of ∼8-nm-sized nanoparticles in YBCO with a high number density, which increases the critical current by a factor of two to three for high magnetic fields.
Journal ArticleDOI
Inducing self-assembly of Y2BaCuO5 nanoparticles via Ca-doping for improved pinning in YBa2Cu3O7−x
Paul N. Barnes,T.J. Haugan,F.J. Baca,F.J. Baca,Chakrapani V. Varanasi,Chakrapani V. Varanasi,R. Wheeler,F. Meisenkothen,S. Sathiraju +8 more
TL;DR: In this paper, Ca-doping of these nanoparticles via addition to the Y211 target material provided an additional increase to the J c (H ) of the pinning process in Y 2 BaCuO 5 (Y211) nanoparticles.
Journal ArticleDOI
Pore and Grain Chemistry during Sintering of Garnet-type Li6.4La3Zr1.4Ta0.6O12 Solid-state Electrolytes
Joshua A. Hammons,Jose Ali Espitia,Erika Ramos Guzman,Rongpei Shi,F. Meisenkothen,Marissa Wood,Maira R. Cerón,Jianchao Ye +7 more
TL;DR: In this article , the authors investigated the energy-intensive sintering process of garnet-type solid-state electrolytes and found that it is necessary and sufficient to achieve high density and ionic conductivity.
Preparation of Atom Probe Specimens Containing Individual Nanoparticles
Mark J. McLean,F. Meisenkothen +1 more
TL;DR: This work presents a straightforward method for creating atom probe specimens from individual nanoparticles of interest on a solid substrate, using a dual beam FIB-SEM instrument equipped with an in-situ nano-manipulator.
A Standards-based Approach to Dopant Quantification Using Atom Probe Tomography
TL;DR: In this paper , the authors used a reference material with a known retained dose of P (NIST SRM 2133, P implant in Si depth profile standard, and calculated the fractions of P + and P2 2+ in the 31 Da peak with the approach outlined in Figure 1.