G
Ganesan Thiagarajan
Researcher at Texas Instruments
Publications - 31
Citations - 177
Ganesan Thiagarajan is an academic researcher from Texas Instruments. The author has contributed to research in topics: Signal & Analog signal. The author has an hindex of 6, co-authored 29 publications receiving 171 citations. Previous affiliations of Ganesan Thiagarajan include Indian Institute of Science.
Papers
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Patent
Wireless network systems
TL;DR: In this paper, a wireless network system includes at least two access points and a distributed set of devices communicatively associated with the access points, each device from among the distributed set consists of a pair of wireless stations and each wireless station is configured to transmit data associated with an alert situation to a distinct access point.
Proceedings ArticleDOI
The effect of sampling jitter in OFDM systems
K.N. Manoj,Ganesan Thiagarajan +1 more
TL;DR: It is shown that the effect of jitter can be looked at as interference between different sub-carriers and derive a lower bound for the variance of the interference in terms of the eigenvalues of the covariance matrix of the jitter process.
Journal ArticleDOI
Novel Transmit Precoding Methods for Rayleigh Fading Multiuser TDD-MIMO Systems With CSIT and No CSIR
TL;DR: Three transmit precoding schemes are proposed that convert the fading MIMO channel into a fixed-gain additive white Gaussian noise (AWGN) channel while satisfying an average power constraint and achieve an infinite diversity order.
Patent
Selecting One of Multiple Antennas to Receive Signals in a Wireless Packet Network
TL;DR: In this paper, the correlation value and gain needed to boost the signal up to a desired power (or the signal strength of the received signal) are determined for each antenna by examining the non-payload portion (e.g., preamble) of the packet.
Proceedings ArticleDOI
Novel BiST methods for parametric test in wireless transceivers
Dallas Webster,Ganesan Thiagarajan,Sthanunathan Ramakrishnan,S. Gunturi,Adesh Sontakke,Donald Y.C. Lie +5 more
TL;DR: RF Built-in Self Test (BiST) techniques to test the performance of a RF CMOS integrated wireless transceiver using on-chip digital resources as both the stimuli and response analyzer are described.