A case database storage/retrieval system comprises a database for storing as a case contents occurred on an object, a script storage section for storing at least one script which describes a typically conducted series of operation and condition descriptions in time order with regard to the object containing the case within the database, a case storage control section for defining a related link between a new case and a specific operation and situation description in the script relating to the new case in order to relate them, and for storing the new case into the database, and a case retrieval section for retrieving to output a case related by the related link from the database, with respect to a specific operation and situation description designated in the specific script.

Case database storage/retrieval system

An interactive medical information display system and method for displaying user-definable patient events is provided. The system includes a mechanism for acquiring physiological parameters from a patient and a mechanism for storing the parameters in a real-time database. In addition, the system includes a mechanism for users to define event types in an event defintion language and a mechanism for users to modify existing event types. Users then select a set of event types for display, and an event generator accesses the database to monitor the physiological parameters in order to detect event occurrences as defined by the event types. A display mechanism displays the event occurrences and provides users with the ability to select event occurrences randomly or sequentially. Upon selection, other information is displayed.

Interactive medical information display system and method for displaying user-definable patient events

A system (10) is provided for analyzing failures arising in computing environments. The system (10) includes an interface (12) which receives information relating to a current failure in a computing environment. A database (18) stores information relating to at least one prior failure in the same computing environment or another computing environment. A processor (22), which is coupled to the interface (12) and the database (18), compares the received information relating to the current failure with the stored information relating to the prior failure in order to find similarities. The processor (22) may then instruct a user to take appropriate action in response to similarities between the current failure and the prior failure, thereby analyzing the failures.

Analysis of failures in a computing environment

A diagnostic system is provided for identifying faults in a machine (e.g., CT scanner, MRI system, x-ray apparatus) by analyzing a data file generated thereby. The diagnostic system includes a trained database containing a plurality of trained data, each trained data associated with one of plurality of known fault types. Each trained data is represented by a trained set of feature values and corresponding weight values. Once a data file is generated by the machine, a current set of feature values are extracted from the data file by performing various analyses (e.g., time domain analysis, frequency domain analysis, wavelet analysis). The current set of feature values extracted is analyzed by a fault detector which produces a candidate set of faults based on the trained set of feature values and corresponding weight values for each of the fault types. The candidate set of faults produced by the fault detector is presented to a user along with a recommend repair procedure. In cases where no fault is identified or in response to a misdiagnosis produced by the diagnostic system, the user may interactively input a faulty condition associated with the machine being diagnosed (e.g., based on his/her experience). The diagnostic system further includes a learning subsystem which automatically updates the plurality of trained data based on the faulty condition input by the user.

Diagnostic system with learning capabilities

In association with a burn-in system for the accelerated life testing of semiconductor devices, of the type including a burn-in driver universally reconfigurable by computer control, a computer software system and method combining interactive systems for designing projects having data for reconfiguring the driver, designing test sequences having data for controlling semiconductor burn-in, designing oven chamber and driver and burn-in board configurations for use in burn-in control, controlling burn-in testing, diagnosing hardware problems, and providing system security. The software system of a multi-purpose computer controlled driver system functions with and controls the burn-in system hardware to accomplish the signal conditioning and testing during the same time period of a wide variety of devices quickly and efficiently with a minimum of system setups and change-overs.

Universal burn-in driver system and method therefor

A method of using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly. A position-dependent, time-ordered test is performed upon the device or assembly to provide a comprehensive error analysis. The error analysis includes an array of error data and information that is time interdependent. Once fault data is stored in memory, a newly-detected fault can be compared with the stored faults. A relationship between the stored fault data and the detected fault is determined. The system indicates the cause of the detected fault to the operator based on stored fault data that is most probably related to the detected fault. Possibilites of faults within the device or assembly are then displayed. This system analysis and range of potential causes can be evaluated by an operator. In this manner, faults not having been contemplated by stored data and information in the adaptive inference system and not bearing a direct relationship to a problem being reviewed can be identified.

Unpredictable fault detection using adaptive inference testing techniques

An adaptive inference system for testing electrical or electronic devices or assemblies. A method is provided for coordinating testing operations in a graphical test sequence presented upon a time dependent display. The method includes the steps of displaying the test data and information along the time dependent axis of a display screen using colored highlighting to identify regions of interest, using next fault searches to automatically locate highlighted areas and using windows positioned alongside data and channel labels along the time dependent axis for initiating an operation or test routine in the graphical test sequence.

System for displaying adaptive inference testing device information

An adaptive inference system for testing electrical or electronic devices or assemblies. A mechanism is provided for performing position-dependent, time-ordered tests upon electrical or electronic devices in order to obtain a test data array. A mechanism is also provided to define a reference array containing acceptable data for comparison with test data. A comparator is connected to the test data array and to the reference array for providing an error array. An error array library is also provided, which contains accumulated error data. Finally, an error array comparator is connected between the error array library and the error array providing a diagnostic analysis of the electrical or electronic devices or assemblies.

Array structure for use in an adaptive inference testing device

A method for using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly. The steps include performing a position-dependent, time-ordered test upon an electrical or electronic device or assembly to provide comprehensive error analysis. The error analysis includes a library of error information. Previously unobserved faults can be detected and located despite their possible remoteness within the device or assembly. When detected faults are compared with error library, a figure of merit is calculated for all possibilities of detected faults.

Method for calculating adaptive inference test figure of merit

A human interactive adaptive inference system for testing electric or electronic devices or assemblies. The system includes a testing mechanism for performing position-dependent, time-ordered tests upon electrical or electronic devices or assemblies. The testing mechanism provides a test data array. The testing mechanism has manually provided test parameters and is adapted to operate under at least one of a plurality of operating modes. A reference array is also provided to contain acceptable data for comparison with test data. A reference comparator is connected to the test data array and to the reference array for providing a diagnostic analysis of the electrical or electronic device or assemblies.

Gregory C. Prestas

Papers

Unpredictable fault detection using adaptive inference testing techniques

System for displaying adaptive inference testing device information

Array structure for use in an adaptive inference testing device

Method for calculating adaptive inference test figure of merit

Interactive adaptive inference system