The invention aims to provide a novel three-dimensional measurement and reconstruction method by providingdigital grating and structure light. The novel three-dimensional measurement and reconstruction method includes the following steps that firstly, a set of sinusoidal stripe grating images with different frequency at different periods is generated, obtained grating images are projected to the surface of the project to be tested through projector and are collected through camera, a phase position is obtained according to novel method of phase unwrapping, and the three-dimensional data of theobject to be tested are obtained and reconstructed in a three-dimensional mode by establishing the relation between camera and projector. According to the novel three-dimensional measurement and reconstruction method by providing the digital grating and the structure light, through a novel phase unwrapping mode, the number of the projected images is optimized, thus the efficiency between image obtaining and data process is improved.

Three-dimensional reconstruction method for determining series of digital grating projection structure light by different frequencies

The invention discloses an object surface micro-scale measurement method based on a pixel grating and computer vision. The method comprises the following steps of: projecting a single-pixel wide-stripe grating pattern by using a projector, and carrying out grating test until a camera can shoot clear stripe pictures; calibrating the camera and the projector; calculating calibration results; carrying out grating projection to obtain a stripe picture; then carrying out image enhancement, denoising, image matting, center line extraction and specific point solving, and calculating space coordinatesof one point on an object by using a space geometry method; and finally, integrating all space coordinates to form an object surface three-dimensional point set, and completing specific surface concave-convex measurement requirements by using the three-dimensional point set. The invention provides a new grating projection image processing and calculating scheme, the research content of grating projection three-dimensional detection is expanded, and the width of each projected stripe can be remarkably reduced by using the single-pixel wide stripes, so that the detection accuracy is greatly improved, and the micro-scale measurement of the surface of the object is realized.

Object surface micro-scale measurement method based on pixel grating and computer vision

The invention relates to a background light elimination method and device, computer equipment and a storage medium. The method comprises the following steps that: under background light, through a projector, projecting multiple sets of phase shift sinusoidal fringes, and obtaining a plurality of deformation fringe patterns; according to the fringe patterns, calculating the fringe sum of each set of phase shift sinusoidal fringes; and according to the fringe sum, calculating the background light component of each deformation fringe pattern; and according to the background light component, processing the plurality of deformation fringe patterns to eliminate the background light components in the plurality of deformation fringe patterns. By use of the method, the background light in the deformation fringe pattern can be quickly and accurately removed.

Background light elimination method and device, computer equipment and storage medium

The invention discloses a space beam absolute position measurement device and a calibration method, relates to the field of space optical precision measurement and solves the problem that in the installing and adjusting process of a precision measurement platform, the absolute position of a beam under a specific global coordinate system cannot be directly measured. The device is technically characterized by comprising a beam absolute position measurement mechanism, wherein the beam absolute position measurement mechanism comprises a substrate, a lens set, a semi-reflective semi-transmissive lens component, two groups of reflector components, a first four-quadrant detector and a second four-quadrant detector; and the lens set, the semi-reflective semi-transmissive lens component and the reflector components are fixed to the substrate respectively, the lens set is placed at the most front end of the substrate, the semi-reflective semi-transmissive lens component is fixed to the back of the lens set, the first four-quadrant detector is placed above the semi-reflective semi-transmissive lens component, the two groups of reflector components are arranged behind the semi-reflective semi-transmissive lens component, and the second four-quadrant detector is placed at one end of the rear side of the reflector components.

Space beam absolute position measurement device and calibration method

The invention relates to a long-range optical surface shape detection device and detection method The surface shape detection device comprises a detection light path and an f-theta angle detection system used for forming a measurement light spot in the detection light path, an incident light path directly incident to the surface of the optical device to be measured is provided with a double-wedge mechanism; the double-wedge mechanism comprises two single wedge-shaped wedges which are arranged at intervals along the incident light path, the incident light path penetrates through the two single wedge-shaped wedges, and the two single wedge-shaped wedges can rotate independently so as to change the angle of the emergent light path of the two single wedge-shaped wedges through rotation and enable the emergent light path to be incident to the surface of the optical device to be measured in a normal incidence mode According to the invention, the reflected light path returns along the original path of the incident light path by rotating the wedge, and judgment can be carried out in combination with measurement light spots; the surface shape of the to-be-detected optical device is obtained through the wedge rotation amount, and the action positions of the optical paths on all the optical elements are consistent, so that the angle errors of all the optical elements introduced by thetransverse movement amount in a traditional system can be completely avoided, and the detection precision is improved

Long-range optical surface shape detection device and method

The invention discloses a three-dimensional measurement method based on improved multi-frequency stripe structured light. The method is characterized by comprising the following steps of 1, generatingmulti-frequency coded stripe images; 2, conducting camera calibration; 3, conducting projector calibration; 4, projecting the coded stripe images and calculating an absolute phase of a stripe image the frequency of which is fn; 5, conducting three-dimensional reconstruction measurement. According to the method, applied equipment is simple, the cost is low, and precise three-dimensional measurement can be carried out on the surfaces of large objects complex in profile and drastic in transition.

Three-dimensional measurement method based on improved multi-frequency stripe structured light

The invention discloses an area array scanning type laser remote three-dimensional measuring system, which comprises a transmitting end and a receiving end connected with a computer terminal, whereinthe transmitting end comprises a single-mode laser device, a liquid crystal light diffusing plate, a first half-wave plate, a first beam expanding unit, an orthogonal polarization structured light generating module, a third reflector, a second beam expanding unit, a first optical wedge, a second optical wedge and a scanning controller which are sequentially connected; the scanning controller is connected with the computer terminal; the receiving end comprises a telescopic unit, a second half-wave plate and a BS beam splitting prism which are sequentially connected; and the receiving end further comprises a second PBS polarizing and beam splitting prism connected with a second connecting end of the BS beam splitting prism, and a third quarter-wave plate, a third PBS polarizing and beam splitting prism and a fifth reflector which are sequentially connected with a third connecting end of the BS beam splitting prism The area array scanning type laser remote three-dimensional measuring system has the advantages of high imaging precision, dynamic detection range and high real-time performance, and can achieve high-precision, long-distance and high-resolution three-dimensional imaging

Area array scanning type laser remote three-dimensional measuring system

The utility model discloses a long-distance structured light three-dimensional measuring device. The device is characterized by being characterized by comprising a base, the system comprises a structured light surface array transmitting end and a modulation information receiving end which are connected by a computer terminal, wherein the structured light surface array transmitting end comprises asingle-mode infrared laser, a liquid crystal light scattering plate, a half-wave plate, a first beam expanding collimation unit, an orthogonal polarization structured light unit, a second beam expanding collimation unit, a KDP wedge-shaped prism scanner and a scanning controller which are connected in sequence; wherein the KDP wedge-shaped prism scanner is aligned with an object to be measured, and the scanning controller is connected with the computer terminal. The long-distance three-dimensional measurement device has the advantages of interference resistance, real-time detection, simple device, low cost and wide measurement range.

Guo Lei

Papers

Three-dimensional measurement method based on improved multi-frequency stripe structured light

Area array scanning type laser remote three-dimensional measuring system

Long-distance structured light three-dimensional measuring device