Mechanical Behavior and Strengthening Mechanisms in Ultrafine Grain Precipitation-Strengthened Aluminum Alloy

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Local Electrode Atom Probe Tomography

We report a source of free electron pulses based on a field emission tip irradiated by a low-power femtosecond laser. The electron pulses are shorter than 70 fs and originate from a tip with an emission area diameter down to 2 nm. Depending on the operating regime we observe either photofield emission or optical field emission with up to 200 electrons per pulse at a repetition rate of 1 GHz. This pulsed electron emitter, triggered by a femtosecond oscillator, could serve as an efficient source for time-resolved electron interferometry, for time-resolved nanometric imaging and for synchrotrons.

https://portal.slac.stanford.edu/sites/ard_public/aard/dla/DLAE163%20Publications/HommelhoffFieldEmissionPaper.pdf

Field emission tip as a nanometer source of free electron femtosecond pulses.

This review presents the historical temporal evolution of an atom-probe tomograph (APT) from its genesis (1973) from field-ion microscope images of individual tungsten atoms (1955). The capabilities of modern APTs employing either electrical or laser pulsing are discussed. The results of the application of APTs to specific materials science problems are presented for research performed at Northwestern University on the following problems: (a) the segregation of Mg at α-Al/Al3Sc heterophase interfaces, (b) phase decomposition in ternary Ni-Al-Cr and quaternary Ni-Al-Cr-Re alloys, and (c) 3-D nanoscale composition mapping of an InAs semiconductor nanowire whose growth was catalyzed by gold. These results demonstrate that it is now possible to obtain highly quantitative information from APT that can be compared with modeling, theory, simulations, and/or first-principles calculations.

H‐O. Andren

Papers

Atom-probe field-ion microscopy