H
H. Yoshida
Researcher at Toshiba
Publications - 3
Citations - 43
H. Yoshida is an academic researcher from Toshiba. The author has contributed to research in topics: Breakdown voltage & Field strength. The author has an hindex of 2, co-authored 3 publications receiving 43 citations.
Papers
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Journal ArticleDOI
Impulse Voltage Field Emission Characteristics and Breakdown Dependency Upon Field Strength in Vacuum Gaps
TL;DR: In this paper, high voltage impulses were used to investigate various possible factors influencing the pre-breakdown current and breakdown in vacuum gaps of sphere-to- sphere and rod-toplane.
Journal ArticleDOI
Degradation Process of Grease Due to SF 6 Gas Dissociation Products
TL;DR: In this article, it is known that some insulating materials are degraded due to dissociation products of SF6 gas, but no studies related to sealing materials, for instance (lubricating) grease and rubber have been made.
Journal ArticleDOI
Voltage Deterioration of XLPE Wires in Water under Gamma Ray Irradiation
TL;DR: In this paper, three types of cross-linked polyethyline (XLPE) wire were developed for insulation of internal pump motors (wet type) used in an advanced boiling water reactor.