scispace - formally typeset
H

Hiroki Shimada

Researcher at University of Tsukuba

Publications -  6
Citations -  22

Hiroki Shimada is an academic researcher from University of Tsukuba. The author has contributed to research in topics: Signal integrity & Double data rate. The author has an hindex of 3, co-authored 6 publications receiving 22 citations.

Papers
More filters
Proceedings ArticleDOI

Signal-integrity improvement based on the segmental-transmission-line

TL;DR: A novel PCB-trace structure called “Segmental-Transmission-Line (STL)” is applied to the 5 GHz differential transmission line and its remarkable SI improvement ratios of 3.38 and 1.7 are shown.
Proceedings ArticleDOI

Signal integrity improvement in lossy transmission line using segmental transmission line

TL;DR: This paper designs and fabricates an STL prototype, and demonstrates that the eye-diagram distorted in the lossy transmission line is improved dramatically more than twice in its eye-height in the STL.
Journal ArticleDOI

A High-Signal-Integrity PCB Trace Composed of Multiple Segments for GHz VLSI Packaging: Its Prototyping and Performance Analysis

TL;DR: This paper designs STLs for GHz bus-systems in which a high SI is indispensable, and demonstrates the high effectiveness of the STL showing the waveforms observed in the STL prototypes.
Proceedings ArticleDOI

Segmental transmission line: Its practical application the optimized PCB trace design using a genetic algorithm

TL;DR: This paper applies the segmental transmission line (STL) to high-speed double data rate (DDR) memory-bus systems, backplane bus systems for basic servers, and high-density trace bus systems, and shows that the performance of the STL on those real world applications has high SI by using real measurements on their prototypes.
Journal ArticleDOI

Digital-signal-waveform improvement on VLSI packaging including inductances

TL;DR: This article applies the segmental transmission line (STL) to a bus system that includes inductances, which come from the very-large-scale integration (VLSI) packaging, and obtained a maximum improvement ratio of 1.53 in the actual experiment.