H
Hua Shen
Researcher at Nanjing University of Science and Technology
Publications - 9
Citations - 57
Hua Shen is an academic researcher from Nanjing University of Science and Technology. The author has contributed to research in topics: Thin film & Electron beam physical vapor deposition. The author has an hindex of 3, co-authored 7 publications receiving 48 citations.
Papers
More filters
Journal ArticleDOI
Influence of annealing temperature on the photoluminescence property of ZnO thin film covered by TiO2 nanoparticles
TL;DR: In this article, the influence of annealing temperature on the photoluminescence property of ZnO thin films was studied, and the structures and surface morphologies of the samples were analyzed by X-ray diffraction (XRD) and atomic force microscope, respectively.
Journal ArticleDOI
Enhanced ultraviolet emission from ZnO thin film covered by TiO 2 nanoparticles
TL;DR: In this paper, a ZnO thin film covered by TiO2 nanoparticles is prepared by electron beam evaporation, and the structure and surface morphology of the sample are analyzed by X-ray diffraction (XRD) and atomic force microscopy (AFM) respectively.
Journal ArticleDOI
Deep learning virtual colorful lens-free on-chip microscopy
Hua Shen,Jinming Gao +1 more
TL;DR: This work presents a virtual colorization by deep learning methods to transfer a gray lens-free microscopy image into a colorful image that might strengthen the monochromatic illumination lens- free microscopy in medical pathology applications and label staining biomedical research.
Journal ArticleDOI
Alignment and efficiency-monitoring method of high-power fiber-to-fiber coupling
TL;DR: In this article, the relationship between alignment error and backscattering power is determined by simulations and experiments, and a state-of-the-art fiber-to-fiber optic switch is developed (transmission efficiency >97%).
Journal ArticleDOI
Regulating effect of SiO2 interlayer on optical properties of ZnO thin films
TL;DR: In this paper, the effect of SiO 2 interlayer with various thicknesses on the optical properties of ZnO/SiO 2 thin films was investigated deeply, and the analysis of X-ray diffraction showed that the ZNO layers in Zn O/Si O 2 nanocomposite films have a wurtzite structure and are preferentially oriented along the c-axis while the SiO2 layers are amorphous.