https://escholarship.org/content/qt6n75v256/qt6n75v256.pdf?t=li5j89

Ambient pressure photoelectron spectroscopy: A new tool for surface science and nanotechnology

Ambient Pressure Photoelectron Spectroscopy: A new tool for surface science and nanotechnology M. Salmeron 1 and R. Schlogl 2 Lawrence Berkeley National Laboratory and Materials Science and Engineering Department, University of California, Berkeley Fritz-Haber Institute of the Max Planck Gesellshaft. Berlin. Germany

Ambient pressure photoelectron spectroscopy: a new tool for surface science and nanotechnology

http://xrm.phys.northwestern.edu/research/pdf_papers/2009/howells_jesrp_2009.pdf

An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

Absolute calibration of small-angle scattering (SAS) intensity data (measured in terms of the differential scattering cross section per unit sample volume per unit solid angle) is essential for many important aspects of quantitative SAS analysis, such as obtaining the number density, volume fraction, and specific surface area of the scatterers. It also enables scattering data from different instruments (light, X-ray, or neutron scattering) to be combined, and it can even be useful to detect the existence of artifacts in the experimental data. Different primary or secondary calibration methods are available. In the latter case, absolute intensity calibration requires a stable artifact with the necessary scattering profile. Glassy carbon has sometimes been selected as this intensity calibration standard. Here we review the spatial homogeneity and temporal stability of one type of commercially available glassy carbon that is being used as an intensity calibration standard at a number of SAS facilities. We demonstrate that glassy carbon is sufficiently homogeneous and stable during routine use to be relied upon as a suitable standard for absolute intensity calibration of SAS data.

/pdf/glassy-carbon-as-an-absolute-intensity-calibration-standard-3qmxwcefrm.pdf

I. Lindan

Papers

Synchrotron radiation instrumentation