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In Chul Yeh
Researcher at University of North Carolina at Chapel Hill
Publications - 5
Citations - 1492
In Chul Yeh is an academic researcher from University of North Carolina at Chapel Hill. The author has contributed to research in topics: Ewald summation & Molecular dynamics. The author has an hindex of 5, co-authored 5 publications receiving 1349 citations.
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Ewald summation for systems with slab geometry
In Chul Yeh,Max L. Berkowitz +1 more
TL;DR: In this article, a modification in the three-dimensional Ewald summation technique was proposed for calculations of long-range Coulombic forces for systems with a slab geometry that are periodic in two dimensions and have a finite length in the third dimension.
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Dielectric constant of water at high electric fields: Molecular dynamics study
In Chul Yeh,Max L. Berkowitz +1 more
TL;DR: In this article, the dielectric constant of water enclosed between Pt(111) surfaces at high external electric fields has been calculated and compared with those obtained by a theoretical prediction and a recent simulation study.
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Photodetachment spectra of Cl−(H2O)n clusters. Predictions and comparisons
TL;DR: In this paper, the photodetachment spectra of Cl − (H 2 O) n (n = 2, 3, /3 15) clusters were calculated using molecular dynamics computer simulations.
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Aqueous solution near charged Ag(111) surfaces: Comparison between a computer simulation and experiment
In Chul Yeh,Max L. Berkowitz +1 more
TL;DR: In this article, the structural properties of aqueous solution near charged Ag(111) surfaces have been investigated using a 2-dimensional Ewald summation technique for the accurate treatment of long-range forces.
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Effects of the polarizability and water density constraint on the structure of water near charged surfaces: Molecular dynamics simulations
In Chul Yeh,Max L. Berkowitz +1 more
TL;DR: In this article, the effect of explicit polarizability into water interaction potential changes the structure of water next to a charged metallic surface and they compared the results from the simulations using polarizable point charge model and simple charge model.