This is the bibliography referenced in the article by Wayne B Nelson titled "A bibliography of accelerated test plans," published in the IEEE Transactions on Reliability June 2005 issue (vol.54, no.2, ISSN 0018-9529).

A bibliography of accelerated test plans part II - references

Accelerated testing has been widely used for several decades. Started with accelerated life tests with constant-stress loadings, more interest has been focused prominently on accelerated degradation tests and time-varying stress loadings. Because accelerated testing is crucial to the assessment of product reliability and the design of warranty policy, it is important to develop an efficacious test plan that encompasses and addresses important issues, such as design of stress profiles, sample allocation, test duration, measurement frequency, and budget constraint. In recent years, extensive research has been conducted on the optimal design of accelerated testing plans, and the consideration of multiple stresses with interactions has become a big challenge in such experimental designs. The purpose of this study is to provide a comprehensive review of important methods for statistical inference and optimal design of accelerated testing plans by compiling the existing body of knowledge in the area of accelerated testing. In this work, different types of test planning strategies are categorized, and their drawbacks and the research trends are provided to assist researchers and practitioners in conducting new research in this area.

A literature review on planning and analysis of accelerated testing for reliability assessment

Purpose – The aim of this research paper is to generalize the previous works on the design of accelerated life tests (ALTs) for periodic inspection and Type I censoring and to promote the use of an exponentiated Weibull (EW) distribution in accelerated life testing.Design/methodology/approach – Statistically optimal ALT plans are suggested for items whose lifetime follows the EW distribution under periodic inspection and Type I censoring. It is assumed that the mean lifetime (scale parameter) is a log‐linear function of stress and that the shape parameters are independent of stress. Given shape parameters, design stress and high test stress, the test plan is optimized with respect to the low test stress and the proportion of test units are also allocated to this test stress. The asymptotic variance (AsVar) of the maximum likelihood estimator of log mean life at the design stress is used as an optimality criterion with equally spaced inspection times. A FORTRAN program was written to calculate the optimal ...

Analysis of optimal accelerated life test plans for periodic inspection: The case of exponentiated Weibull failure model

Purpose. This paper describes the following bibliography of statistical plans for accelerated tests. This introduction provides background on accelerated testing and test plans. The body of this paper briefly surveys the literature on theory for accelerated test plans and the considerations that go into choosing or developing such plans. Many plans need to be developed, especially for degradation models. The author welcomes additions to and corrections of the bibliography, which is available on request as a searchable updated Word file, which includes email addresses of authors.

An updated bibliography of accelerated test plans

Accelerated life test (ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accurately, quickly, and economically. With the promotion of the national strategy of civil-military integration, ALT will be widely used in the research and development (R&D) of various types of products, and the ALT plan design theory will face further challenges. To aid engineers in selecting appropriate theories and to stimulate researchers to develop the theories required in engineering, with focus on the demands for theory research that arise from the implementation of ALT, this paper reviews and summarizes the development of ALT plan design theory. The development of the theory and method for planning optimal ALT for location-scale distribution, which is the most applied and mature theory of designing the optimal ALT plan, are described in detail. Taking this as the center of radiation, some problems that ALT now faces, such as the verification of the statistical model, limitation of sample size, solutions of resource limits, optimization of the test arrangement, and management of product complexity, are discussed, and the general ideas and methods of solving these problems are analyzed. Suggestions for selecting appropriate ALT plan design theories are proposed, and the urgent solved theory problems and opinions of their solutions are proposed. Based on the principle of convenience for engineers to select appropriate methods according to the problems found in practice, this paper reviews the development of optimal ALT plan design theory by taking the engineering problems arising from the ALT implementation as the main thread, provides guidelines on selecting appropriate theories for engineers, and proposes opinions about the urgent solved theory problems for researchers.

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Design of Accelerated Life Test Plans—Overview and Prospect

Statistically optimal accelerated life test plans are determined for the case of Rayleigh failure distribution under the assumptions of periodic inspection and Type I censoring and two stress levels. For optimal plans the proportion of test units allocated to the low stress level and equally spaced inspection times are determined such that the asymptotic variance of the maximum likelihood estimator of p-th quantile at the use condition is minimized. Procedures for selecting a sample size are also discussed.

Islam

Papers

Optimal design of accelerated life test plans under periodic inspection and type I censoring: The case of Rayleigh failure law