J
J.M. Hogan
Researcher at General Electric
Publications - 1
Citations - 7
J.M. Hogan is an academic researcher from General Electric. The author has contributed to research in topics: Electronics cooling & Mean time between failures. The author has an hindex of 1, co-authored 1 publications receiving 4 citations.
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The effect of fan-reliability and cooling-performance on electronic-chassis reliability
TL;DR: In this paper, a tractable model for predicting the failure rates of electronic chassis cooled by fans with finite failure rates is developed, which directly applies to cost/benefit studies in electronics packaging, including the determination of the improvement in mean time between failures (MTBF) to be anticipated when a chassis is implemented with a cooling fan.