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James Bessen

Researcher at Boston University

Publications -  113
Citations -  5998

James Bessen is an academic researcher from Boston University. The author has contributed to research in topics: Patent troll & Productivity. The author has an hindex of 34, co-authored 106 publications receiving 5393 citations. Previous affiliations of James Bessen include Massachusetts Institute of Technology.

Papers
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Journal ArticleDOI

Sequential innovation, patents, and imitation

TL;DR: In this article, the authors argue that if innovation is both sequential and complementary, competition can increase firms' future profits thus offsetting short-term dissipation of rents, and they also show that in such a dynamic industry, patent protection may reduce overall innovation and social welfare.
Posted Content

Introduction to Patent Failure: How Judges, Bureaucrats, and Lawyers Put Innovators at Risk

TL;DR: Bessen and Meurer as mentioned in this paper presented a wide range of empirical evidence from history, law, and economics to show how the patent system has failed in providing predictable legal boundaries, and presented a call for change in institutions and laws.
Book

Patent Failure: How Judges, Bureaucrats, and Lawyers Put Innovators at Risk

TL;DR: This book explains why property rights work, how property rights fail, and how to make Patents Work as Property.
Journal ArticleDOI

The Value of U.S. Patents by Owner and Patent Characteristics

TL;DR: This article used renewal data to estimate the value of U.S. patents, controlling for patent and owner characteristics, and found that patent citations explain little variance in patent value, suggesting limits to their use as a measure of patent quality.
Journal ArticleDOI

The value of U.S. patents by owner and patent characteristics

TL;DR: This article used renewal data to estimate the value of U.S. patents, controlling for patent and owner characteristics, and found that patent citations explain little variance in patent value, suggesting limits to their use as a measure of patent quality.