Showing papers by "James C. Wyant published in 2003"
Patent•
29 Aug 2003
TL;DR: In this article, a polarizing point-diffraction plate is used to produce common-path test and reference wavefronts with mutually orthogonal polarizations from an input wavefront.
Abstract: A polarizing point-diffraction plate is used to produce common-path test and reference wavefronts with mutually orthogonal polarizations from an input wavefront. The common-path test and reference wavefronts are collimated, phase shifted and interfered, and the resulting interferograms are imaged on a detector. The interference patterns are then processed using conventional algorithms to characterize the input light wavefront.
26 citations
TL;DR: A new instrument, the polarization phase-shifting point-diffraction interferometer, has been developed by use of a birefringent pinhole plate and a new model used to determine the quality of the reference wavefront from the pinhole as a function of pinhole size and test optic aberrations is presented.
Abstract: A new point-diffraction interferometer has been developed utilizing a birefringent pinhole plate, which allows for phase-shifting by changing the polarization state of the laser source. The interferometer is compact, simple to align, vibration insensitive and can phase-shift without moving parts or separate reference optics.
21 citations
TL;DR: In this paper, a phase shift, point diffraction interferometer that achieves high accuracy and is capable of measuring a single pulse of light is presented. And the operational limits and accuracies of the technique are discussed.
Abstract: We demonstrate a phase-shift, point diffraction interferometer that achieves high accuracy and is capable of measuring a single pulse of light. Results of measuring transient phenomena and numerical apertures as high as NA 0.8 are presented. The operational limits and accuracies of the technique are discussed.
4 citations
TL;DR: In this article, an instantaneous phase-shifting interferometer (PhaseCam, 4D Technology) was modified to a speckle phase-shift interferer, which was used to measure carbon fiber.
Abstract: An instantaneous phase-shifting interferometer (PhaseCam, 4D Technology) was modified to a speckle phase-shifted interferometer. This interferometer was used to measure “diffused” objects such as a carbon fiber. Repeatability, accuracy, and dynamic range of the interferometer were measured. Different phase shifting algorithms were utilized to get rid of the high frequency speckle that modulates the low frequency fringes.
2 citations