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James S. Sharp

Researcher at University of Nottingham

Publications -  53
Citations -  1912

James S. Sharp is an academic researcher from University of Nottingham. The author has contributed to research in topics: Thin film & Glass transition. The author has an hindex of 23, co-authored 53 publications receiving 1759 citations. Previous affiliations of James S. Sharp include University of Sheffield & University of Waterloo.

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Free surfaces cause reductions in the glass transition temperature of thin polystyrene films.

TL;DR: Results show that free surfaces are crucial for observing T(g) reductions in thin polymer films and address the role of the sample preparation history.
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Surface denaturation and amyloid fibril formation of insulin at model lipid-water interfaces

TL;DR: This study shows that both the adsorption and unfolding kinetics of insulin can be described by a sum of exponential processes and that different surfaces behave differently, with respect both to one another and to the bulk protein solution.
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Dielectric and ellipsometric studies of the dynamics in thin films of isotactic poly(methylmethacrylate) with one free surface

TL;DR: The dielectric loss was found to exhibit no discernible film thickness dependence in either the temperature of the maximum loss value or the shape of the loss curve, and the measured T(g) values were found to decrease with decreasing film thickness with a maximum shift of 10 K for a 7-nm film.
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The properties of free polymer surfaces and their influence on the glass transition temperature of thin polystyrene films.

TL;DR: The combined ellipsometry and embedding studies suggest that a liquid-like surface layer exists in glassy PS films and provide an estimate for the lower bound of the thickness of this layer of 3-4 nm and show that this surface layer has properties similar to those of a bulk sample of PS having a temperature of 374 K.
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Time-resolved light scattering studies of phase separation in thin film semiconducting polymer blends during spin-coating

TL;DR: In this paper, a light scattering apparatus with integrated spin-coater measures both specular reflectivity and off-specular scattering to monitor changes in the film thickness during spinning, while off-spatial scattering is used to observe the onset of phase separation and then to monitor the evolution of length scales in the phase-separating blend.