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Showing papers by "Jean-Marc Defise published in 2011"

Journal Article•DOI•
Straylight-Rejection Performance of the STEREO HI Instruments

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Jean-Philippe Halain1, C. J. Eyles2, C. J. Eyles3, Alexandra Mazzoli1, Danielle Bewsher4, Jackie A. Davies2, Emmanuel Mazy1, P. Rochus1, Jean-Marc Defise1, Christopher J. Davis2, Richard A. Harrison2, S. R. Crothers2, Daniel Stephen Brown4, Clarence M. Korendyke5, John D. Moses5, Dennis G. Socker5, Russell A. Howard5, Jeffrey S. Newmark5, Jeffrey S. Newmark6 •
University of Liège1, Rutherford Appleton Laboratory2, University of Valencia3, University of Central Lancashire4, United States Naval Research Laboratory5, NASA Headquarters6
06 Jul 2011-Solar Physics
TL;DR: The SECCHI Heliospheric Imager (HI) instruments on-board the STEREO spacecraft have been collecting images of solar wind transients, including coronal mass ejections, as they propagate through the inner heliosphere since the beginning of 2007.
Abstract: The SECCHI Heliospheric Imager (HI) instruments on-board the STEREO spacecraft have been collecting images of solar wind transients, including coronal mass ejections, as they propagate through the inner heliosphere since the beginning of 2007.

11 citations

Journal Article•DOI•
Handheld modern computer brings new features to portable X-ray fluorescence coating thickness measurement device

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Alain Carapelle1, Jean-Marc Defise1, David Strivay1, Henri-Pierre Garnir1•
University of Liège1
01 Jun 2011-Computer Physics Communications
TL;DR: X-ray fluorescence is routinely used to measure coating thickness on table top setup and the user interface is “push button” to allow the utilization by nonspecialized operator.

4 citations