J
Jens Gibmeier
Researcher at Karlsruhe Institute of Technology
Publications - 146
Citations - 1845
Jens Gibmeier is an academic researcher from Karlsruhe Institute of Technology. The author has contributed to research in topics: Residual stress & Stress (mechanics). The author has an hindex of 17, co-authored 134 publications receiving 1457 citations. Previous affiliations of Jens Gibmeier include Applied Materials & Helmholtz-Zentrum Berlin.
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Residual stresses in deep-drawn cups made of duplex stainless steel X2CrNiN23-4: Influence of the drawing depth
TL;DR: In this paper, a two-scale approach combining finite element modeling with a mean field homogenization scheme was used to calculate macro residual stresses and phase specific residual stresses for steel X2CrNiN23-4 for various drawing depths.
Proceedings ArticleDOI
Consideration of Tool Chamfer for Realistic Application of the Incremental Hole-Drilling Method
Jens Gibmeier,Nicola Simon +1 more
TL;DR: The incremental hole-drilling method is well-established in residual stress analysis but widely used six-blade milling bits have rather large chamfers at the cutting edges, which result in hole geometries that clearly differ from the ideal cylindrical blind hole.
Journal ArticleDOI
Interrelation between Microstructure and Residual Stresses for Low-Pressure Carburizing of Steel AISI 5120 under Defined Process Parameter Variation
TL;DR: In this article , a systematic parameter study and advanced characterization was carried out to quantify the influence of these process parameters on the resulting material state, showing that the retained austenite content and its depth profile change significantly for certain process parameters, reaching contents of up to 45 vol% in the near surface region.
Journal ArticleDOI
On the Oscillating Course of dhkl−sin2ψ Plots for Plastically Deformed, Cold-Rolled Ferritic and Duplex Stainless Steel Sheets
TL;DR: In this paper , the phase-specific lattice strain response under increasing tensile deformation was analyzed continuously with a sampling rate of 0.5 Hz with an in situ experiment with high-energy synchrotron X-ray diffraction.