J
Jinting Cui
Researcher at University of Electronic Science and Technology of China
Publications - 10
Citations - 74
Jinting Cui is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Thin film & Ceramic. The author has an hindex of 3, co-authored 5 publications receiving 17 citations.
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High temperature static and dynamic strain response of PdCr thin film strain gauge prepared on Ni-based superalloy
TL;DR: In this paper, a thin film resistance strain gauge was developed to monitor the in-situ static and dynamic strain of engine blades in aerospace propulsion and power generation system. But the results of static testing demonstrate that the resistance of the gauge exhibits a linear change dependent on strain and displays excellent repeatability.
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Investigation of high temperature electrical insulation property of MgO ceramic films and the influence of annealing process
TL;DR: In this article, the structural and morphologies of the MgO-300 ceramic film were investigated by X-ray diffraction and scanning electron microscopy, which indicated that the growth of grains and repair of defects improved the insulation performance.
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Fabrication and characterization of nickel thin film as resistance temperature detector
TL;DR: In this article, the fabrication of Ni RTDs at low temperatures is investigated by direct-current (DC) magnetron sputtering, and the effects of sputter pressure and power on thin film microscopic morphology and structure are also investigated.
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Influence of a heterolayered Al2O3–ZrO2/Al2O3 ceramic protective overcoat on the high temperature performance of PdCr thin film strain gauges
TL;DR: In this article, a heterolayered Al2O3-ZrO2/Al 2O3 ceramic film was used as a protective overcoat over the PdCr sensitive thin film.
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Effect of thickness on the electrical properties of PdCr strain sensitive thin film
TL;DR: In this article, the electrical properties of palladium chromium strain sensitive films with various thicknesses were fabricated onto sapphire substrates by direct current magnetron sputtering, and the results showed that the electrical property of PdCr strain films are strongly dependent on their thickness.