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Joseph N. Tan

Researcher at National Institute of Standards and Technology

Publications -  54
Citations -  1440

Joseph N. Tan is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Ion & Electron beam ion trap. The author has an hindex of 20, co-authored 54 publications receiving 1340 citations. Previous affiliations of Joseph N. Tan include University of Missouri.

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Bragg Diffraction from Crystallized Ion Plasmas

TL;DR: Knowledge of the properties of one-component plasma crystals is required for models of white dwarfs and neutron stars, which are believed to contain matter in that form.

Bragg diffraction from crystallized ion plasmas

TL;DR: In this article, single crystals of a one-component plasma were observed by optical Bragg diffraction and the plasmas contained 105 to 106 single positive beryllium-9 ions (9Be+) at particle densities of 108 to 109 per cubic centimeter.
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EUV spectra of highly-charged ions W54+–W63+ relevant to ITER diagnostics

TL;DR: In this article, the first measurements and detailed analysis of extreme ultraviolet (EUV) spectra of highly-charged tungsten ions W54+ to W63+ obtained with an electron beam ion trap (EBIT) are presented.
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Spectra of W39+–W47+ in the 12–20 nm region observed with an EBIT light source

TL;DR: In this paper, a collisional-radiative model of the EBIT plasma was used to identify the lines of W39+, W44+, W46+ and W47.