J
Jung-Cheun Lien
Researcher at University of Southern California
Publications - 5
Citations - 62
Jung-Cheun Lien is an academic researcher from University of Southern California. The author has contributed to research in topics: Boundary scan & Graph (abstract data type). The author has an hindex of 3, co-authored 5 publications receiving 60 citations.
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Proceedings ArticleDOI
A test and maintenance controller for a module containing testable chips
Melvin A. Breuer,Jung-Cheun Lien +1 more
TL;DR: A design of a module test and maintenance controller (MMC) is presented that is able to test every chip in a module via an ETM-BUS or a boundary scan bus.
Proceedings ArticleDOI
Concurrent control of multiple BIT structures
TL;DR: A generic control graph for activating common built-in test structures is derived and its microprogrammed and hardwired implementations described, and two designs for this generic controller are presented.
Journal ArticleDOI
An optimal scheduling algorithm for testing interconnect using boundary scan
Jung-Cheun Lien,Melvin A. Breuer +1 more
TL;DR: This article modeled using a directed graph found necessary and sufficient conditions for obtaining an optimal schedule when the graph is acyclic, and an algorithm for constructing an optimaldule for any graph.
Journal ArticleDOI
Test program synthesis for modules and chips having boundary scan
Jung-Cheun Lien,Melvin A. Breuer +1 more
TL;DR: The focus of this article is on the automated test program synthesis techniques employed in BOLD that can greatly reduce test program development costs.
Concurrent Control of Multiple BIT
TL;DR: A generic control graph for activating common BIT structures is derived and its microprogrammed and hardwired implementations described, along with simulation results of area/test time tradeoffs.