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K

K. Beyerlein

Researcher at Georgia Institute of Technology

Publications -  2
Citations -  95

K. Beyerlein is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Pixel & Field of view. The author has an hindex of 2, co-authored 2 publications receiving 88 citations.

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Journal ArticleDOI

Subpixel Response Measurement of Near‐Infrared Detectors

TL;DR: In this paper, a near-infrared spot projection system has been developed, and the effect of subpixel non-uniformity was studied, showing that for detectors with near 100% internal quantum efficiency, 1% photometry can be achieved with a point-spread function (PSF) size of about half a pixel.
Journal ArticleDOI

Sub-Pixel Response Measurement of Near-Infrared Sensors

TL;DR: In this article, a near-infrared spot projection system was developed to precisely characterize nearinfrared focal plane arrays and to study the effect of sub-pixel non uniformity on precision photometry.